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NN325TRHARQ1

NN325TRHARQ1

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    QFN40_EP

  • 描述:

    IC TOUCH MNGR MULTI-SENSE 40VQFN

  • 数据手册
  • 价格&库存
NN325TRHARQ1 数据手册
NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Multisensing Touch Manager FEATURES 1 • • • 2 • • • • • • • Qualified for Automotive Applications Low Supply Voltage Range: 1.8 V to 3.6 V Ultra-Low-Power Consumption – Active Mode: 270 µA at 1 MHz, 2.2 V – Standby Mode: 0.7 µA – Off Mode (RAM Retention): 0.1 µA Ultra-Fast Wakeup From Standby Mode in Less Than 1 µs 16-Bit RISC Architecture, 62.5-ns Instruction Cycle Time Basic Clock Module Configurations – Internal Frequencies up to 16 MHz With Four Calibrated Frequencies to ±1% – Internal Very-Low-Power Low-Frequency Oscillator – 32-kHz Crystal – High-Frequency (HF) Crystal up to 16 MHz – Resonator – External Digital Clock Source – External Resistor 16-Bit Timer_A With Three Capture/Compare Registers 16-Bit Timer_B With Three Capture/Compare Registers Universal Serial Communication Interface (USCI) – Enhanced UART With Auto-Baudrate Detection (LIN) – IrDA Encoder and Decoder – Synchronous SPI – I2C 10-Bit 200-ksps Analog-to-Digital Converter (ADC) With Internal Reference, Sample-andHold, Autoscan, and Data Transfer Controller • • • • • • • Brownout Detector Serial Onboard Programming, No External Programming Voltage Needed, Programmable Code Protection by Security Fuse Bootstrap Loader (BSL) On-Chip Emulation Module Family Members Include: – NN325 – 32KB + 256B Flash Memory – 1KB RAM Available in a 40-Pin QFN Package (RHA) For Complete Module Descriptions, See the MSP430x2xx Family User's Guide (SLAU144) APPLICATIONS • Optical Touch Screen DESCRIPTION The NN325 device is an ultra-low-power multisensing touch manager that includes optimized peripherals dedicated for high-performance touch-sensing applications. The device is optimized for ultra-low power operation using five low-power modes. The embedded powerful 16-bit RISC core based on a MSP430™ architecture offers 16-bit registers and constant generators to achieve maximum code efficiency. The digitally controlled oscillator (DCO) allows wakeup from low-power modes to active mode in less than 1 µs. The ultra-low-power core comes together with two built-in 16-bit timers, a universal serial communication interface (USCI), a 10-bit ADC with integrated reference and data transfer controller (DTC), and 32 I/O pins. 1 2 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. MSP430 is a trademark of Texas Instruments. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2013, Texas Instruments Incorporated NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Functional Block Diagram VCC P1.x/P2.x VSS 2x8 P3.x/P4.x 2x8 XOUT XIN Basic Clock System+ ADC10 10-Bit ACLK Flash RAM 32kB 1kB SMCLK MCLK 16MHz CPU incl. 16 Registers Ports P1/P2 Ports P3/P4 2x8 I/O Interrupt capability, pullup/down resistors 12 Channels, Autoscan, DTC 2x8 I/O pullup/down resistors MAB MDB Emulation (2BP) JTAG Interface Timer_B3 Brownout Protection Watchdog WDT+ 15/16−Bit Timer_A3 3 CC Registers Spy−Bi Wire 3 CC Registers, Shadow Reg USCI_A0: UART/LIN, IrDA, SPI USCI_B0: SPI, I2C RST/NMI 2 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. Device Pinout P1.2/TA1 P1.3/TA2 P1.4/SMCLK/TCK P1.5/TA0/TMS P1.6/TA1/TDI/TCLK P1.7/TA2/TDO/TDI TEST/SBWTCK DVCC DVCC P2.5/ROSC RHA PACKAGE (TOP VIEW) 39 38 37 36 35 34 33 32 DVSS 1 30 P1.1/TA0 XOUT/P2.7 2 29 P1.0/TACLK/ADC10CLK XIN/P2.6 3 28 P2.4/TA2/A4/VREF+/VeREF+ DVSS 4 27 P2.3/TA1/A3/VREF−/VeREF− RST/NMI/SBWTDIO 5 26 P3.7/A7 P2.0/ACLK/A0 6 25 P3.6/A6 P2.1/TAINCLK/SMCLK/A1 7 24 P3.5/UCA0RXD/UCA0SOMI P2.2/TA0/A2 8 23 P3.4/UCA0TXD/UCA0SIMO P3.0/UCB0STE/UCA0CLK/A5 9 22 P4.7/TBCLK 21 P4.6/TBOUTH/A15 P3.1/UCB0SIMO/UCB0SDA 10 P4.5/TB2/A14 P4.4/TB1/A13 P4.3/TB0/A12 P4.2/TB2 P4.1/TB1 P4.0/TB0 AVCC AVSS P3.3/UCB0CLK/UCA0STE P3.2/UCB0SOMI/UCB0SCL 12 13 14 15 16 17 18 19 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 3 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Table 1. Terminal Functions TERMINAL NAME NO. I/O DESCRIPTION RHA General-purpose digital I/O pin P1.0/TACLK/ADC10CLK 29 I/O Timer_A, clock signal TACLK input ADC10, conversion clock General-purpose digital I/O pin P1.1/TA0 30 I/O Timer_A, capture: CCI0A input, compare: OUT0 output BSL transmit P1.2/TA1 31 I/O P1.3/TA2 32 I/O P1.4/SMCLK/TCK 33 I/O General-purpose digital I/O pin Timer_A, capture: CCI1A input, compare: OUT1 output General-purpose digital I/O pin Timer_A, capture: CCI2A input, compare: OUT2 output General-purpose digital I/O pin SMCLK signal output Test Clock input for device programming and test General-purpose digital I/O pin P1.5/TA0/TMS 34 I/O Timer_A, compare: OUT0 output Test Mode Select input for device programming and test General-purpose digital I/O pin P1.6/TA1/TDI/TCLK 35 I/O Timer_A, compare: OUT1 output Test Data Input or Test Clock Input for programming and test General-purpose digital I/O pin P1.7/TA2/TDO/TDI (1) 36 I/O Timer_A, compare: OUT2 output Test Data Output or Test Data Input for programming and test General-purpose digital I/O pin P2.0/ACLK/A0 6 I/O ACLK output ADC10, analog input A0 General-purpose digital I/O pin Timer_A, clock signal at INCLK P2.1/TAINCLK/SMCLK/A1 7 I/O SMCLK signal output ADC10, analog input A1 General-purpose digital I/O pin Timer_A, capture: CCI0B input, compare: OUT0 output P2.2/TA0/A2 8 I/O BSL receive ADC10, analog input A2 General-purpose digital I/O pin Timer_A, capture CCI1B input, compare: OUT1 output P2.3/TA1/A3/ VREF-/VeREF- 27 I/O ADC10, analog input A3 Negative reference voltage output/input General-purpose digital I/O pin Timer_A, compare: OUT2 output P2.4/TA2/A4/ VREF+/VeREF+ 28 I/O ADC10, analog input A4 Positive reference voltage output/input (1) 4 TDO or TDI is selected via JTAG instruction. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Table 1. Terminal Functions (continued) TERMINAL NAME NO. I/O DESCRIPTION RHA P2.5/ROSC 40 I/O XIN/P2.6 3 I/O XOUT/P2.7 2 I/O General-purpose digital I/O pin Input for external DCO resistor to define DCO frequency Input terminal of crystal oscillator General-purpose digital I/O pin Output terminal of crystal oscillator General-purpose digital I/O pin (2) General-purpose digital I/O pin P3.0/UCB0STE/UCA0CLK/A5 9 I/O USCI_B0 slave transmit enable USCI_A0 clock input/output ADC10, analog input A5 General-purpose digital I/O pin P3.1/UCB0SIMO/UCB0SDA 10 I/O USCI_B0 slave in, master out (SPI mode) USCI_B0 SDA I2C data (I2C mode) General-purpose digital I/O pin P3.2/UCB0SOMI/UCB0SCL 11 I/O USCI_B0 slave out, master in (SPI mode) USCI_B0 SCL I2C clock (I2C mode) General-purpose digital I/O pin P3.3/UCB0CLK/UCA0STE 12 I/O USCI_B0 clock input/output USCI_A0 slave transmit enable General-purpose digital I/O pin P3.4/UCA0TXD/UCA0SIMO 23 I/O USCI_A0 transmit data output (UART mode) USCI_A0 slave in, master out (SPI mode) General-purpose digital I/O pin P3.5/UCA0RXD/UCA0SOMI 24 I/O USCI_A0 receive data input in UART mode USCI_A0 slave out/master in SPI mode General-purpose digital I/O pin P3.6/A6 25 I/O P3.7/A7 26 I/O P4.0/TB0 15 I/O P4.1/TB1 16 I/O P4.2/TB2 17 I/O P4.3/TB0/A12 18 I/O ADC10 analog input A6 General-purpose digital I/O pin ADC10 analog input A7 General-purpose digital I/O pin Timer_B, capture: CCI0A input, compare: OUT0 output General-purpose digital I/O pin Timer_B, capture: CCI1A input, compare: OUT1 output General-purpose digital I/O pin Timer_B, capture: CCI2A input, compare: OUT2 output General-purpose digital I/O pin Timer_B, capture: CCI0B input, compare: OUT0 output ADC10 analog input A12 General-purpose digital I/O pin P4.4/TB1/A13 19 I/O Timer_B, capture: CCI1B input, compare: OUT1 output ADC10 analog input A13 (2) If XOUT/P2.7 is used as an input, excess current flows until P2SEL.7 is cleared. This is due to the oscillator output driver connection to this pad after reset. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 5 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Table 1. Terminal Functions (continued) TERMINAL NAME NO. I/O DESCRIPTION RHA General-purpose digital I/O pin P4.5/TB2/A14 20 I/O Timer_B, compare: OUT2 output ADC10 analog input A14 General-purpose digital I/O pin P4.6/TBOUTH/A15 21 I/O Timer_B, switch all TB0 to TB3 outputs to high impedance ADC10 analog input A15 P4.7/TBCLK 22 I/O RST/NMI/SBWTDIO 5 I TEST/SBWTCK 37 I General-purpose digital I/O pin Timer_B, clock signal TBCLK input Reset or nonmaskable interrupt input Spy-Bi-Wire test data input/output during programming and test Selects test mode for JTAG pins on Port 1. The device protection fuse is connected to TEST. Spy-Bi-Wire test clock input during programming and test DVCC 38, 39 Digital supply voltage AVCC 14 Analog supply voltage DVSS 1, 4 Digital ground reference AVSS 13 QFN Pad 6 Pad Analog ground reference NA QFN package pad; connection to DVSS recommended. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Short-Form Description CPU The MSP430™ CPU has a 16-bit RISC architecture that is highly transparent to the application. All operations, other than program-flow instructions, are performed as register operations in conjunction with seven addressing modes for source operand and four addressing modes for destination operand. Program Counter PC/R0 Stack Pointer SP/R1 SR/CG1/R2 Status Register Constant Generator CG2/R3 General-Purpose Register R4 General-Purpose Register R5 General-Purpose Register R6 General-Purpose Register R7 General-Purpose Register R8 General-Purpose Register R9 General-Purpose Register R10 Instruction Set General-Purpose Register R11 The instruction set consists of 51 instructions with three formats and seven address modes. Each instruction can operate on word and byte data. Table 2 shows examples of the three types of instruction formats; Table 3 shows the address modes. General-Purpose Register R12 General-Purpose Register R13 General-Purpose Register R14 General-Purpose Register R15 The CPU is integrated with 16 registers that provide reduced instruction execution time. The register-toregister operation execution time is one cycle of the CPU clock. Four of the registers, R0 to R3, are dedicated as program counter, stack pointer, status register, and constant generator respectively. The remaining registers are general-purpose registers. Peripherals are connected to the CPU using data, address, and control buses and can be handled with all instructions. Table 2. Instruction Word Formats EXAMPLE OPERATION Dual operands, source-destination INSTRUCTION FORMAT ADD R4,R5 R4 + R5 → R5 Single operands, destination only CALL R8 PC → (TOS), R8 → PC JNE Jump-on-equal bit = 0 Relative jump, unconditional/conditional Table 3. Address Mode Descriptions ADDRESS MODE D (2) SYNTAX EXAMPLE Register ✓ ✓ MOV Rs,Rd MOV R10,R11 R10 → R11 Indexed ✓ ✓ MOV X(Rn),Y(Rm) MOV 2(R5),6(R6) M(2+R5) → M(6+R6) Symbolic (PC relative) ✓ ✓ MOV EDE,TONI M(EDE) → M(TONI) Absolute ✓ ✓ MOV &MEM,&TCDAT M(MEM) → M(TCDAT) Indirect ✓ MOV @Rn,Y(Rm) MOV @R10,Tab(R6) M(R10) → M(Tab+R6) Indirect autoincrement ✓ MOV @Rn+,Rm MOV @R10+,R11 M(R10) → R11 R10 + 2 → R10 Immediate ✓ MOV #X,TONI MOV #45,TONI #45 → M(TONI) (1) (2) S (1) OPERATION S = source D = destination Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 7 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Operating Modes The NN325-Q1 has one active mode and five software-selectable low-power modes of operation. An interrupt event can wake up the device from any of the five low-power modes, service the request, and restore back to the low-power mode on return from the interrupt program. The following six operating modes can be configured by software: • Active mode (AM) – All clocks are active. • Low-power mode 0 (LPM0) – CPU is disabled. – ACLK and SMCLK remain active. MCLK is disabled. • Low-power mode 1 (LPM1) – CPU is disabled ACLK and SMCLK remain active. MCLK is disabled. – DCO dc-generator is disabled if DCO not used in active mode. • Low-power mode 2 (LPM2) – CPU is disabled. – MCLK and SMCLK are disabled. – DCO dc-generator remains enabled. – ACLK remains active. • Low-power mode 3 (LPM3) – CPU is disabled. – MCLK and SMCLK are disabled. – DCO dc-generator is disabled. – ACLK remains active. • Low-power mode 4 (LPM4) – CPU is disabled. – ACLK is disabled. – MCLK and SMCLK are disabled. – DCO dc-generator is disabled. – Crystal oscillator is stopped. 8 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Interrupt Vector Addresses The interrupt vectors and the power-up starting address are located in the address range of 0FFFFh to 0FFC0h. The vector contains the 16-bit address of the appropriate interrupt handler instruction sequence. If the reset vector (located at address 0FFFEh) contains 0FFFFh (for example, if flash is not programmed), the CPU goes into LPM4 immediately after power up. Table 4. Interrupt Vector Addresses INTERRUPT SOURCE INTERRUPT FLAG SYSTEM INTERRUPT WORD ADDRESS PRIORITY Power-up External reset Watchdog Flash key violation PC out-of-range (1) PORIFG RSTIFG WDTIFG KEYV (2) Reset 0FFFEh 31, highest NMI Oscillator fault Flash memory access violation NMIIFG OFIFG ACCVIFG (2) (3) (non)-maskable, (non)-maskable, (non)-maskable 0FFFCh 30 Timer_B3 TBCCR0 CCIFG (4) maskable 0FFFAh 29 Timer_B3 TBCCR1 and TBCCR2 CCIFGs, TBIFG (2) (4) maskable 0FFF8h 28 0FFF6h 27 Watchdog Timer WDTIFG maskable 0FFF4h 26 Timer_A3 TACCR0 CCIFG (see Note 3) maskable 0FFF2h 25 Timer_A3 TACCR1 CCIFG TACCR2 CCIFG TAIFG (2) (4) maskable 0FFF0h 24 USCI_A0/USCI_B0 Receive UCA0RXIFG, UCB0RXIFG (2) maskable 0FFEEh 23 USCI_A0/USCI_B0 Transmit UCA0TXIFG, UCB0TXIFG (2) maskable 0FFECh 22 ADC10 ADC10IFG (4) maskable 0FFEAh 21 0FFE8h 20 (1) (2) (3) (4) (5) (6) I/O Port P2 (eight flags) P2IFG.0 to P2IFG.7 (2) (4) maskable 0FFE6h 19 I/O Port P1 (eight flags) P1IFG.0 to P1IFG.7 (2) (4) maskable 0FFE4h 18 0FFE2h 17 0FFE0h 16 (5) 0FFDEh 15 (6) 0FFDCh to 0FFC0h 14 to 0, lowest A reset is generated if the CPU tries to fetch instructions from within the module register memory address range (0h to 01FFh) or from within unused address range. Multiple source flags (non)-maskable: the individual interrupt-enable bit can disable an interrupt event, but the general interrupt enable cannot. Nonmaskable: neither the individual nor the general interrupt-enable bit will disable an interrupt event. Interrupt flags are located in the module. This location is used as bootstrap loader security key (BSLSKEY). A 0AA55h at this location disables the BSL completely. A zero (0h) disables the erasure of the flash if an invalid password is supplied. The interrupt vectors at addresses 0FFDCh to 0FFC0h are not used in this device and can be used for regular program code if necessary. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 9 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Special Function Registers Most interrupt and module enable bits are collected into the lowest address space. Special function register bits not allocated to a functional purpose are not physically present in the device. Simple software access is provided with this arrangement. Legend rw rw-0, 1 rw-(0), (1) Bit can be read and written. Bit can be read and written. It is Reset or Set by PUC. Bit can be read and written. It is Reset or Set by POR. SFR bit is not present in device. Table 5. Interrupt Enable 1 Address 7 6 00h WDTIE OFIE NMIIE ACCVIE 5 4 1 0 ACCVIE NMIIE 3 2 OFIE WDTIE rw-0 rw-0 rw-0 rw-0 Watchdog timer interrupt enable. Inactive if watchdog mode is selected. Active if watchdog timer is configured in interval timer mode. Oscillator fault interrupt enable (Non)maskable interrupt enable Flash access violation interrupt enable Table 6. Interrupt Enable 2 Address 7 6 5 4 01h UCA0RXIE UCA0TXIE UCB0RXIE UCB0TXIE 3 2 1 0 UCB0TXIE UCB0RXIE UCA0TXIE UCA0RXIE rw-0 rw-0 rw-0 rw-0 USCI_A0 receive-interrupt enable USCI_A0 transmit-interrupt enable USCI_B0 receive-interrupt enable USCI_B0 transmit-interrupt enable Table 7. Interrupt Flag Register 1 Address 7 6 5 02h WDTIFG OFIFG RSTIFG PORIFG NMIIFG 4 3 2 1 0 NMIIFG RSTIFG PORIFG OFIFG WDTIFG rw-0 rw-(0) rw-(1) rw-1 rw-(0) Set on watchdog timer overflow (in watchdog mode) or security key violation. Reset on VCC power-up or a reset condition at RST/NMI pin in reset mode. Flag set on oscillator fault External reset interrupt flag. Set on a reset condition at RST/NMI pin in reset mode. Reset on VCC power up. Power-on reset interrupt flag. Set on VCC power up. Set via RST/NMI pin Table 8. Interrupt Flag Register 2 Address 7 6 03h UCA0RXIFG UCA0TXIFG UCB0RXIFG UCB0TXIFG 10 5 4 3 2 1 0 UCB0TXIFG UCB0RXIFG UCA0TXIFG UCA0RXIFG rw-1 rw-0 rw-1 rw-0 USCI_A0 receive-interrupt flag USCI_A0 transmit-interrupt flag USCI_B0 receive-interrupt flag USCI_B0 transmit-interrupt flag Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Memory Organization Table 9. Memory Organization NN325 Memory Main: interrupt vector Main: code memory Size Flash Flash 32KB Flash 0FFFFh-0FFC0h 0FFFFh-08000h Information memory Size Flash 256 Byte 010FFh-01000h Boot memory Size ROM 1KB 0FFFh-0C00h Size 1KB 05FFh-0200h 16-bit 8-bit 8-bit SFR 01FFh-0100h 0FFh-010h 0Fh-00h RAM Peripherals Bootstrap Loader (BSL) The bootstrap loader (BSL) enables users to program the flash memory or RAM using a UART serial interface. Access to the NN325-Q1 memory via the BSL is protected by user-defined password. For complete description of the features of the BSL and its implementation, see the MSP430 Programming Via the Bootstrap Loader User’s Guide (SLAU319). Table 10. BSL Function Pins BSL FUNCTION RHA PACKAGE PINS Data transmit 30 - P1.1 Data receive 8 - P2.2 Flash Memory The flash memory can be programmed via the JTAG port, the bootstrap loader, or in-system by the CPU. The CPU can perform single-byte and single-word writes to the flash memory. Features of the flash memory include: • Flash memory has n segments of main memory and four segments of information memory (A to D) of 64 bytes each. Each segment in main memory is 512 bytes in size. • Segments 0 to n may be erased in one step, or each segment may be individually erased. • Segments A to D can be erased individually, or as a group with segments 0 to n. Segments A to D are also called information memory. • Segment A contains calibration data. After reset, segment A is protected against programming and erasing. It can be unlocked, but care should be taken not to erase this segment if the device-specific calibration data is required. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 11 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Peripherals Peripherals are connected to the CPU through data, address, and control buses and can be handled using all instructions. For complete module descriptions, see the MSP430x2xx Family User's Guide (SLAU144). Oscillator and System Clock The clock system is supported by the basic clock module that includes support for a 32768-Hz watch crystal oscillator, an internal very-low-power low-frequency oscillator, an internal digitally-controlled oscillator (DCO), and a high-frequency crystal oscillator. The basic clock module is designed to meet the requirements of both low system cost and low power consumption. The internal DCO provides a fast turn-on clock source and stabilizes in less than 1 µs. The basic clock module provides the following clock signals: • Auxiliary clock (ACLK), sourced from a 32768-Hz watch crystal, a high-frequency crystal, or the internal verylow-power LF oscillator. • Main clock (MCLK), the system clock used by the CPU. • Sub-Main clock (SMCLK), the sub-system clock used by the peripheral modules. Table 11. DCO Calibration Data (Provided From Factory in Flash Information Memory Segment A) DCO FREQUENCY 1 MHz 8 MHz 12 MHz 16 MHz CALIBRATION REGISTER SIZE ADDRESS CALBC1_1MHZ byte 010FFh CALDCO_1MHZ byte 010FEh CALBC1_8MHZ byte 010FDh CALDCO_8MHZ byte 010FCh CALBC1_12MHZ byte 010FBh CALDCO_12MHZ byte 010FAh CALBC1_16MHZ byte 010F9h CALDCO_16MHZ byte 010F8h Brownout The brownout circuit is implemented to provide the proper internal reset signal to the device during power on and power off. Digital I/O There are four 8-bit I/O ports implemented—ports P1, P2, P3, and P4: • All individual I/O bits are independently programmable. • Any combination of input, output, and interrupt condition is possible. • Edge-selectable interrupt input capability for all eight bits of port P1 and P2. • Read/write access to port-control registers is supported by all instructions. • Each I/O has an individually programmable pullup/pulldown resistor. Because there are only three I/O pins implemented from port P2, bits [5:1] of all port P2 registers read as 0, and write data is ignored. Watchdog Timer (WDT+) The primary function of the WDT+ module is to perform a controlled system restart after a software problem occurs. If the selected time interval expires, a system reset is generated. If the watchdog function is not needed in an application, the module can be disabled or configured as an interval timer and can generate interrupts at selected time intervals. 12 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Timer_A3 Timer_A3 is a 16-bit timer/counter with three capture/compare registers. Timer_A3 can support multiple capture/compares, PWM outputs, and interval timing. Timer_A3 also has extensive interrupt capabilities. Interrupts may be generated from the counter on overflow conditions and from each of the capture/compare registers. Table 12. Timer_A3 Signal Connections INPUT PIN NUMBER RHA 29 - P1.0 DEVICE INPUT SIGNAL MODULE INPUT NAME MODULE BLOCK MODULE OUTPUT SIGNAL TACLK TACLK Timer NA ACLK ACLK CCR0 TA0 OUTPUT PIN NUMBER RHA SMCLK SMCLK 7 - P2.1 TAINCLK INCLK 30 - P1.1 TA0 CCI0A 8 - P2.2 TA0 CCI0B 8 - P2.2 VSS GND 34 - P1.5 30 - P1.1 VCC VCC 31 - P1.2 TA1 CCI1A 27 - P2.3 TA1 CCI1B 27 - P2.3 VSS GND 35 - P1.6 VCC VCC 32 - P1.3 CCR1 CCR2 TA1 TA2 31 - P1.2 TA2 CCI2A ACLK (internal) CCI2B 32 - P1.3 28 - P2.4 VSS GND 36 - P1.7 VCC VCC Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 13 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Timer_B3 Timer_B3 is a 16-bit timer/counter with three capture/compare registers. Timer_B3 can support multiple capture/compares, PWM outputs, and interval timing. Timer_B3 also has extensive interrupt capabilities. Interrupts may be generated from the counter on overflow conditions and from each of the capture/compare registers. Table 13. Timer_B3 Signal Connections INPUT PIN NUMBER RHA 22 - P4.7 DEVICE INPUT SIGNAL MODULE INPUT NAME MODULE BLOCK MODULE OUTPUT SIGNAL TBCLK TBCLK Timer NA ACLK ACLK CCR0 TB0 SMCLK SMCLK 22 - P4.7 TBCLK INCLK 15 - P4.0 TB0 CCI0A 18 - P4.3 TB0 CCI0B VSS GND VCC VCC 16 - P4.1 TB1 CCI1A 19 - P4.4 TB1 CCI1B VSS GND VCC VCC 17 - P4.2 TB2 CCI2A ACLK (internal) CCI2B VSS GND VCC VCC OUTPUT PIN NUMBER RHA 15 - P4.0 18 - P4.3 CCR1 TB1 16 - P4.1 19 - P4.4 CCR2 TB2 17 - P4.2 20 - P4.5 Universal Serial Communications Interface (USCI) The USCI module is used for serial data communication. The USCI module supports synchronous communication protocols like SPI (3 or 4 pin), I2C and asynchronous communication protocols such as UART, enhanced UART with automatic baudrate detection (LIN), and IrDA. USCI_A0 provides support for SPI (3 or 4 pin), UART, enhanced UART, and IrDA. USCI_B0 provides support for SPI (3 or 4 pin) and I2C. ADC10 The ADC10 module supports fast, 10-bit analog-to-digital conversions. The module implements a 10-bit SAR core, sample select control, reference generator and data transfer controller, or DTC, for automatic conversion result handling allowing ADC samples to be converted and stored without any CPU intervention. 14 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Peripheral File Map Table 14. Peripherals With Word Access MODULE ADC10 REGISTER NAME SHORT NAME ADDRESS OFFSET ADC10SA 1BCh ADC memory ADC10MEM 1B4h ADC control register 1 ADC10CTL1 1B2h ADC control register 0 ADC10CTL0 1B0h ADC analog enable 0 ADC10AE0 04Ah ADC data transfer start address ADC analog enable 1 Timer_B ADC10AE1 04Bh ADC data transfer control register 1 ADC10DTC1 049h ADC data transfer control register 0 ADC10DTC0 048h Capture/compare register TBCCR2 0196h Capture/compare register TBCCR1 0194h Capture/compare register TBCCR0 0192h Timer_B register TBR 0190h Capture/compare control TBCCTL2 0186h Capture/compare control TBCCTL1 0184h Capture/compare control TBCCTL0 0182h Timer_B control Timer_A TBCTL 0180h Timer_B interrupt vector TBIV 011Eh Capture/compare register TACCR2 0176h Capture/compare register TACCR1 0174h Capture/compare register TACCR0 0172h TAR 0170h Capture/compare control TACCTL2 0166h Capture/compare control TACCTL1 0164h Capture/compare control TACCTL0 0162h TACTL 0160h Timer_A register Timer_A control Timer_A interrupt vector Flash Memory TAIV 012Eh Flash control 3 FCTL3 012Ch Flash control 2 FCTL2 012Ah FCTL1 0128h WDTCTL 0120h Flash control 1 Watchdog Timer+ Watchdog/timer control Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 15 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Table 15. Peripherals With Byte Access MODULE USCI_B0 REGISTER NAME SHORT NAME ADDRESS OFFSET USCI_B0 transmit buffer UCB0TXBUF 06Fh USCI_B0 receive buffer UCB0RXBUF 06Eh UCB0STAT 06Dh UCB0BR1 06Bh USCI_B0 bit rate control 0 UCB0BR0 06Ah USCI_B0 control 1 UCB0CTL1 069h USCI_B0 control 0 UCB0CTL0 068h USCI_B0 I2C slave address UCB0SA 011Ah USCI_B0 I2C own address UCB0OA 0118h USCI_A0 transmit buffer UCA0TXBUF 067h USCI_A0 receive buffer UCA0RXBUF 066h USCI_A0 status UCA0STAT 065h USCI_A0 modulation control UCA0MCTL 064h USCI_A0 baud rate control 1 UCA0BR1 063h USCI_A0 baud rate control 0 UCA0BR0 062h USCI_A0 control 1 UCA0CTL1 061h USCI_A0 control 0 UCA0CTL0 060h USCI_B0 status USCI_B0 bit rate control 1 USCI_A0 Basic Clock System+ Port P4 USCI_A0 IrDA receive control UCA0IRRCTL 05Fh USCI_A0 IrDA transmit control UCA0IRTCTL 05Eh USCI_A0 auto baud rate control UCA0ABCTL 05Dh Basic clock system control 3 BCSCTL3 053h Basic clock system control 2 BCSCTL2 058h Basic clock system control 1 BCSCTL1 057h DCO clock frequency control DCOCTL 056h Port P4 resistor enable P4REN 011h Port P4 selection P4SEL 01Fh Port P4 direction P4DIR 01Eh Port P4 output P4OUT 01Dh P4IN 01Ch Port P4 input Port P3 Port P3 resistor enable P3REN 010h Port P3 selection P3SEL 01Bh Port P3 direction P3DIR 01Ah Port P3 output P3OUT 019h P3IN 018h Port P3 input Port P2 Port P2 resistor enable P2REN 02Fh Port P2 selection P2SEL 02Eh P2IE 02Dh Port P2 interrupt edge select P2IES 02Ch Port P2 interrupt flag P2IFG 02Bh Port P2 direction P2DIR 02Ah Port P2 output P2OUT 029h P2IN 028h Port P2 interrupt enable Port P2 input 16 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Table 15. Peripherals With Byte Access (continued) MODULE Port P1 REGISTER NAME SHORT NAME ADDRESS OFFSET Port P1 resistor enable P1REN 027h Port P1 selection P1SEL 026h P1IE 025h Port P1 interrupt edge select P1IES 024h Port P1 interrupt flag P1IFG 023h Port P1 direction P1DIR 022h Port P1 output Port P1 interrupt enable Special Function P1OUT 021h Port P1 input P1IN 020h SFR interrupt flag 2 IFG2 003h SFR interrupt flag 1 IFG1 002h SFR interrupt enable 2 IE2 001h SFR interrupt enable 1 IE1 000h Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 17 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Absolute Maximum Ratings (1) Voltage applied at VCC to VSS Voltage applied to any pin -0.3 V to 4.1 V (2) -0.3 V to VCC + 0.3 V Diode current at any device terminal Storage temperature, Tstg (1) ±2 mA (3) Unprogrammed device -55°C to 150°C Programmed device -55°C to 150°C Stresses beyond those listed under absolute maximum ratingsmay cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditionsis not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltages referenced to VSS. The JTAG fuse-blow voltage, VFB, is allowed to exceed the absolute maximum rating. The voltage is applied to the TEST pin when blowing the JTAG fuse. Higher temperature may be applied during board soldering process according to the current JEDEC J-STD-020 specification with peak reflow temperatures not higher than classified on the device label on the shipping boxes or reels. (2) (3) Recommended Operating Conditions (1) (2) MIN VCC Supply voltage Supply voltage TA Operating free-air temperature fSYSTEM Processor frequency (maximum MCLK frequency) (1) (2) (see Figure 1) (1) (2) MAX UNIT During program execution 1.8 3.6 V During program/erase flash memory 2.2 3.6 V T version -40 105 °C VCC = 1.8 V, Duty cycle = 50% ±10% dc 4.15 VCC = 2.7 V, Duty cycle = 50% ±10% dc 12 VCC ≥ 3.3 V, Duty cycle = 50% ±10% dc 16 AVCC = DVCC = VCC VSS NOM AVSS = DVSS = VSS 0 V MHz The CPU is clocked directly with MCLK. Both the high and low phase of MCLK must not exceed the pulse width of the specified maximum frequency. Modules might have a different maximum input clock specification. See the specification of the respective module in this data sheet. Legend : System Frequency −MHz 16 MHz Supply voltage range, during flash memory programming 12 MHz Supply voltage range, during program execution 7.5 MHz 4.15 MHz 1.8 V 2.2 V 2.7 V 3.3 V 3.6 V Supply Voltage −V NOTE: Minimum processor frequency is defined by system clock. Flash program or erase operations require a minimum VCC of 2.2 V. Figure 1. Operating Area 18 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Active Mode Supply Current (into DVCC + AVCC) Excluding External Current (1) (2) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER IAM,1MHz IAM,1MHz IAM,4kHz IAM,100kHz TEST CONDITIONS TA MIN TYP MAX 2.2 V 270 390 Active mode (AM) current (1 MHz) fDCO = fMCLK = fSMCLK = 1 MHz, fACLK = 32768 Hz, Program executes in flash, BCSCTL1 = CALBC1_1MHZ, DCOCTL = CALDCO_1MHZ, CPUOFF = 0, SCG0 = 0, SCG1 = 0, OSCOFF = 0 3V 390 550 2.2 V 240 Active mode (AM) current (1 MHz) fDCO = fMCLK = fSMCLK = 1 MHz, fACLK = 32768 Hz, Program executes in RAM, BCSCTL1 = CALBC1_1MHZ, DCOCTL = CALDCO_1MHZ, CPUOFF = 0, SCG0 = 0, SCG1 = 0, OSCOFF = 0 3.3 V 340 Active mode (AM) current (4 kHz) fMCLK = fSMCLK = fACLK = 32768 Hz/8 = 4096 Hz, fDCO = 0 Hz, Program executes in flash, SELMx = 11, SELS = 1, DIVMx = DIVSx = DIVAx = 11, CPUOFF = 0, SCG0 = 1, SCG1 = 0, OSCOFF = 0 Active mode (AM) current (100 kHz) fMCLK = fSMCLK = fDCO(0, 0) ≈ 100 kHz, fACLK = 0 Hz, Program executes in flash, RSELx = 0, DCOx = 0, CPUOFF = 0, SCG0 = 0, SCG1 = 0, OSCOFF = 1 -40°C to 85°C 2.2 V 5 105°C -40°C to 85°C -40°C to 85°C µA µA 9 µA 6 10 3V 20 2.2 V 60 105°C -40°C to 85°C UNIT 18 105°C 105°C (1) (2) VCC 85 95 3V 72 µA 95 105 All inputs are tied to 0 V or VCC . Outputs do not source or sink any current. The currents are characterized with a Micro Crystal CC4V-T1A SMD crystal with a load capacitance of 9 pF. The internal and external load capacitance is chosen to closely match the required 9 pF. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 19 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Typical Characteristics - Active-Mode Supply Current (Into DVCC + AVCC) ACTIVE-MODE CURRENT vs SUPPLY VOLTAGE TA = 25°C ACTIVE-MODE CURRENT vs DCO FREQUENCY 8.0 5.0 f DCO = 16 MHz 7.0 TA = 85 °C Active Mode Current − mA Active Mode Current − mA 4.0 6.0 f DCO = 12 MHz 5.0 4.0 f DCO = 8 MHz 3.0 2.0 TA = 25 °C 3.0 VCC = 3 V 2.0 TA = 85 °C TA = 25 °C 1.0 1.0 0.0 1.5 VCC = 2.2 V f DCO = 1 MHz 2.0 2.5 3.0 3.5 4.0 0.0 0.0 VCC − Supply Voltage − V 8.0 12.0 16.0 f DCO − DCO Frequency − MHz Figure 2. 20 4.0 Figure 3. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Low-Power-Mode Supply Currents (Into VCC ) Excluding External Current (1) (2) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER ILPM0,1MHz ILPM0,100kHz ILPM2 ILPM3,LFXT1 TEST CONDITIONS TA (1) (2) (3) (4) (5) TYP MAX 2.2 V 75 90 Low-power mode 0 (LPM0) current (3) 3V 90 120 2.2 V 37 48 Low-power mode 0 (LPM0) current (3) fMCLK = 0 MHz, fSMCLK = fDCO(0, 0) ≈ 100 kHz, fACLK = 0 Hz, RSELx = 0, DCOx = 0, CPUOFF = 1, SCG0 = 0, SCG1 = 0, OSCOFF = 1 3V 41 65 22 29 Low-power mode 2 (LPM2) current (4) fMCLK = fSMCLK = 0 MHz, fDCO = 1 MHz, fACLK = 32768 Hz, BCSCTL1 = CALBC1_1MHZ, DCOCTL = CALDCO_1MHZ, CPUOFF = 1, SCG0 = 0, SCG1 = 1, OSCOFF = 0 Low-power mode 3 (LPM3) current (4) fDCO = fMCLK = fSMCLK = 0 MHz, fACLK = 32768 Hz, CPUOFF = 1, SCG0 = 1, SCG1 = 1, OSCOFF = 0 -40°C to 85°C Low-power mode 3 current, (LPM3) (4) fDCO = fMCLK = fSMCLK = 0 MHz, fACLK from internal LF oscillator (VLO), CPUOFF = 1, SCG0 = 1, SCG1 = 1, OSCOFF = 0 Low-power mode 4 (LPM4) current (5) fDCO = fMCLK = fSMCLK = 0 MHz, fACLK = 0 Hz, CPUOFF = 1, SCG0 = 1, SCG1 = 1, OSCOFF = 1 2.2 V 105°C -40°C to 85°C 31 3V 25 105°C 0.7 1.4 0.7 1.4 2.4 3.3 105°C 5 10 -40°C 0.9 1.5 0.9 1.5 2.6 3.8 105°C 6 12 -40°C 0.4 1 25°C 0.5 1 1.8 2.9 25°C 85°C 2.2 V 3V 2.2 V 105°C 4.5 9 -40°C 0.5 1.2 0.6 1.2 2.1 3.3 25°C 3V 105°C 5.5 11 -40°C 0.1 0.5 0.1 0.5 1.5 3 4.5 9 25°C 85°C 105°C µA µA µA 34 25°C 85°C UNIT 32 -40°C 85°C ILPM4 MIN fMCLK = 0 MHz, fSMCLK = fDCO = 1 MHz, fACLK = 32768 Hz, BCSCTL1 = CALBC1_1MHZ, DCOCTL = CALDCO_1MHZ, CPUOFF = 1, SCG0 = 0, SCG1 = 0, OSCOFF = 0 85°C ILPM3,VLO VCC 2.2 V, 3V µA µA µA All inputs are tied to 0 V or VCC . Outputs do not source or sink any current. The currents are characterized with a Micro Crystal CC4V-T1A SMD crystal with a load capacitance of 9 pF. The internal and external load capacitance is chosen to closely match the required 9 pF. Current for brownout and WDT clocked by SMCLK included. Current for brownout and WDT clocked by ACLK included. Current for brownout included. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 21 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Schmitt-Trigger Inputs (Ports P1, P2, P3, P4, and RST/NMI) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VIT+ TEST CONDITIONS Positive-going input threshold voltage VCC MIN Negative-going input threshold voltage Vhys Input voltage hysteresis (VIT+ - VIT- ) RPull Pullup/pulldown resistor For pullup: VIN = VSS, For pulldown: VIN = VCC CI Input capacitance VIN = VSS or VCC MAX 0.45 VCC 0.75 VCC 1 1.65 1.35 2.25 0.25 VCC 0.55 VCC 2.2 V 0.55 1.20 3V 0.75 1.65 2.2 V 0.1 1 3V 0.3 1 3V 20 2.2 V 3V VIT- TYP 35 50 5 UNIT V V V kΩ pF Inputs (Ports P1, P2) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER t(int) (1) External interrupt timing TEST CONDITIONS Port P1, P2: P1.x to P2.x, External trigger pulse width to set interrupt flag (1) VCC 2.2 V, 3 V MIN TYP MAX 20 UNIT ns An external signal sets the interrupt flag every time the minimum interrupt pulse width t(int) is met. It may be set even with trigger signals shorter than t(int) . Leakage Current (Ports P1, P2, P3, and P4) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER Ilkg(Px.y) (1) (2) 22 High-impedance leakage current TEST CONDITIONS (1) (2) VCC 2.2 V, 3 V MIN TYP MAX UNIT ±50 nA The leakage current is measured with VSS or VCC applied to the corresponding pin(s), unless otherwise noted. The leakage of the digital port pins is measured individually. The port pin is selected for input and the pullup/pulldown resistor is disabled. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Outputs (Ports P1, P2, P3, and P4) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS IOH(max) = -1.5 mA VOH High-level output voltage IOH(max) = -6 mA (2) IOH(max) = -1.5 mA (1) IOH(max) = -6 mA (2) IOL(max) = 1.5 mA VOL Low-level output voltage (2) 2.2 V 3V (1) 2.2 V IOL(max) = 6 mA (2) IOL(max) = 1.5 mA (1) IOL(max) = 6 mA (2) (1) VCC (1) 3V MIN MAX VCC - 0.25 VCC VCC - 0.6 VCC VCC - 0.25 VCC VCC - 0.6 VCC VSS VSS + 0.25 VSS VSS + 0.6 VSS VSS + 0.25 VSS VSS + 0.6 UNIT V V The maximum total current, IOH(max) and IOL(max), for all outputs combined, should not exceed ±12 mA to hold the maximum voltage drop specified. The maximum total current, IOH(max) and IOL(max), for all outputs combined, should not exceed ±48 mA to hold the maximum voltage drop specified. Output Frequency (Ports P1, P2, P3, and P4) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS fPx.y Port output frequency (with load) P1.4/SMCLK, CL = 20 pF, RL = 1 kΩ against VCC/2 (1) (2) fPort_CLK Clock output frequency P2.0/ACLK, P1.4/SMCLK, CL = 20 pF (2) (1) (2) VCC MIN TYP MAX 2.2 V 10 3V 12 2.2 V 12 3V 16 UNIT MHz MHz Alternatively, a resistive divider with two 2-kΩ resistors between VCC and VSS is used as load. The output is connected to the center tap of the divider. The output voltage reaches at least 10% and 90% VCC at the specified toggle frequency. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 23 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Typical Characteristics - Outputs One output loaded at a time. TYPICAL LOW-LEVEL OUTPUT CURRENT vs LOW-LEVEL OUTPUT VOLTAGE TYPICAL LOW-LEVEL OUTPUT CURRENT vs LOW-LEVEL OUTPUT VOLTAGE 50.0 VCC = 2.2 V P4.5 TA = 25°C 20.0 I OL − Typical Low-Level Output Current − mA I OL − Typical Low-Level Output Current − mA 25.0 TA = 85°C 15.0 10.0 5.0 0.0 0.0 0.5 1.0 1.5 2.0 VCC = 3 V P4.5 TA = 85°C 30.0 20.0 10.0 0.0 0.0 2.5 0.5 VOL − Low-Level Output V oltage − V Figure 4. I OH − Typical High-Level Output Current − mA I OH − Typical High-Level Output Current − mA 2.0 2.5 3.0 3.5 0.0 VCC = 2.2 V P4.5 −5.0 −10.0 −15.0 TA = 85°C TA = 25°C 0.5 1.0 1.5 2.0 2.5 VCC = 3 V P4.5 −10.0 −20.0 −30.0 −40.0 −50.0 0.0 VOH − High-Level Output V oltage − V Figure 6. 24 1.5 TYPICAL HIGH-LEVEL OUTPUT CURRENT vs HIGH-LEVEL OUTPUT VOLTAGE 0.0 −25.0 0.0 1.0 VOL − Low-Level Output V oltage − V Figure 5. TYPICAL HIGH-LEVEL OUTPUT CURRENT vs HIGH-LEVEL OUTPUT VOLTAGE −20.0 TA = 25°C 40.0 Submit Documentation Feedback TA = 85°C TA = 25°C 0.5 1.0 1.5 2.0 2.5 3.0 3.5 VOH − High-Level Output V oltage − V Figure 7. Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 POR/Brownout Reset (BOR) (1) (2) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS VCC(start) See Figure 8 dVCC /dt ≤ 3 V/s V(B_IT-) See Figure 8 through Figure 10 dVCC /dt ≤ 3 V/s Vhys(B_IT-) See Figure 8 dVCC /dt ≤ 3 V/s td(BOR) See Figure 8 t(reset) Pulse length needed at RST/NMI pin to accepted reset internally (1) (2) VCC MIN TYP MAX 0.7 × V(B_IT-) 70 3V 130 UNIT V 1.71 V 210 mV 2000 µs 2 µs The current consumption of the brownout module is already included in the ICC current consumption data. The voltage level V(B_IT-) + Vhys(B_IT-) is ≤ 1.8 V. During power up, the CPU begins code execution following a period of td(BOR) after VCC = V(B_IT-) + Vhys(B_IT-) . The default DCO settings must not be changed until VCC ≥ VCC(min), where VCC(min) is the minimum supply voltage for the desired operating frequency. VCC Vhys(B_IT−) V(B_IT−) VCC(start) 1 0 t d(BOR) Figure 8. POR/Brownout Reset (BOR) vs Supply Voltage Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 25 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Typical Characteristics - POR/Brownout Reset (BOR) VCC 3V 2 VCC(drop) − V VCC = 3 V Typical Conditions t pw 1.5 1 VCC(drop) 0.5 0 0.001 1 1000 1 ns 1 ns t pw − Pulse Width − µs t pw − Pulse Width − µs Figure 9. VCC(drop) Level With a Square Voltage Drop to Generate a POR/Brownout Signal VCC 2 t pw 3V VCC(drop) − V VCC = 3 V 1.5 Typical Conditions 1 VCC(drop) 0.5 0 0.001 t f = tr 1 1000 tf tr t pw − Pulse Width − µs t pw − Pulse Width − µs Figure 10. VCC(drop) Level With a Triangle Voltage Drop to Generate a POR/Brownout Signal 26 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Main DCO Characteristics • • • All ranges selected by RSELx overlap with RSELx + 1: RSELx = 0 overlaps RSELx = 1, ... RSELx = 14 overlaps RSELx = 15. DCO control bits DCOx have a step size as defined by parameter SDCO . Modulation control bits MODx select how often fDCO(RSEL,DCO+1) is used within the period of 32 DCOCLK cycles. The frequency fDCO(RSEL,DCO) is used for the remaining cycles. The frequency is an average equal to: faverage = 32 × fDCO(RSEL,DCO) × fDCO(RSEL,DCO+1) MOD × fDCO(RSEL,DCO) + (32 – MOD) × fDCO(RSEL,DCO+1) DCO Frequency over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS VCC MIN TYP MAX RSELx < 14 1.8 3.6 RSELx = 14 2.2 3.6 UNIT VCC Supply voltage range 3.0 3.6 fDCO(0,0) DCO frequency (0, 0) RSELx = 0, DCOx = 0, MODx = 0 2.2 V, 3 V 0.06 0.14 MHz fDCO(0,3) DCO frequency (0, 3) RSELx = 0, DCOx = 3, MODx = 0 2.2 V, 3 V 0.07 0.17 MHz fDCO(1,3) DCO frequency (1, 3) RSELx = 1, DCOx = 3, MODx = 0 2.2 V, 3 V 0.10 0.20 MHz fDCO(2,3) DCO frequency (2, 3) RSELx = 2, DCOx = 3, MODx = 0 2.2 V, 3 V 0.14 0.28 MHz fDCO(3,3) DCO frequency (3, 3) RSELx = 3, DCOx = 3, MODx = 0 2.2 V, 3 V 0.20 0.40 MHz fDCO(4,3) DCO frequency (4, 3) RSELx = 4, DCOx = 3, MODx = 0 2.2 V, 3 V 0.28 0.54 MHz fDCO(5,3) DCO frequency (5, 3) RSELx = 5, DCOx = 3, MODx = 0 2.2 V, 3 V 0.39 0.77 MHz fDCO(6,3) DCO frequency (6, 3) RSELx = 6, DCOx = 3, MODx = 0 2.2 V, 3 V 0.54 1.06 MHz fDCO(7,3) DCO frequency (7, 3) RSELx = 7, DCOx = 3, MODx = 0 2.2 V, 3 V 0.80 1.50 MHz fDCO(8,3) DCO frequency (8, 3) RSELx = 8, DCOx = 3, MODx = 0 2.2 V, 3 V 1.10 2.10 MHz fDCO(9,3) DCO frequency (9, 3) RSELx = 9, DCOx = 3, MODx = 0 2.2 V, 3 V 1.60 3.00 MHz fDCO(10,3) DCO frequency (10, 3) RSELx = 10, DCOx = 3, MODx = 0 2.2 V, 3 V 2.50 4.30 MHz fDCO(11,3) DCO frequency (11, 3) RSELx = 11, DCOx = 3, MODx = 0 2.2 V, 3 V 3.00 5.50 MHz fDCO(12,3) DCO frequency (12, 3) RSELx = 12, DCOx = 3, MODx = 0 2.2 V, 3 V 4.30 7.30 MHz fDCO(13,3) DCO frequency (13, 3) RSELx = 13, DCOx = 3, MODx = 0 2.2 V, 3 V 6.00 9.60 MHz fDCO(14,3) DCO frequency (14, 3) RSELx = 14, DCOx = 3, MODx = 0 2.2 V, 3 V 8.60 13.9 MHz fDCO(15,3) DCO frequency (15, 3) RSELx = 15, DCOx = 3, MODx = 0 3V 12.0 18.5 MHz fDCO(15,7) DCO frequency (15, 7) RSELx = 15, DCOx = 7, MODx = 0 3V 16.0 26.0 MHz SRSEL Frequency step between range RSEL and RSEL+1 SRSEL = fDCO(RSEL+1,DCO) /fDCO(RSEL,DCO) 2.2 V, 3 V 1.55 ratio SDCO Frequency step between tap DCO and DCO+1 SDCO = fDCO(RSEL,DCO+1) /fDCO(RSEL,DCO) 2.2 V, 3 V 1.05 1.08 1.12 ratio Duty cycle Measured at P1.4/SMCLK 2.2 V, 3 V 40 50 60 RSELx = 15 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 V % 27 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Calibrated DCO Frequencies - Tolerance at Calibration over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS Frequency tolerance at calibration TA VCC MIN TYP MAX UNIT 25°C 3V -1 ±0.2 +1 % 25°C 3V 0.990 1 1.010 MHz fCAL(1MHz) 1-MHz calibration value BCSCTL1 = CALBC1_1MHZ, DCOCTL = CALDCO_1MHZ, Gating time: 5 ms fCAL(8MHz) 8-MHz calibration value BCSCTL1 = CALBC1_8MHZ, DCOCTL = CALDCO_8MHZ, Gating time: 5 ms 25°C 3V 7.920 8 8.080 MHz fCAL(12MHz) 12-MHz calibration value BCSCTL1 = CALBC1_12MHZ, DCOCTL = CALDCO_12MHZ, Gating time: 5 ms 25°C 3V 11.88 12 12.12 MHz fCAL(16MHz) 16-MHz calibration value BCSCTL1 = CALBC1_16MHZ, DCOCTL = CALDCO_16MHZ, Gating time: 2 ms 25°C 3V 15.84 16 16.16 MHz MAX UNIT Calibrated DCO Frequencies - Tolerance Over Temperature 0°C to 85°C over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER fCAL(1MHz) fCAL(8MHz) fCAL(12MHz) fCAL(16MHz) 28 TA VCC 1-MHz tolerance over temperature 0°C to 85°C 3V -2.5 ±0.5 +2.5 % 8-MHz tolerance over temperature 0°C to 85°C 3V -2.5 ±1.0 +2.5 % 12-MHz tolerance over temperature 0°C to 85°C 3V -2.5 ±1.0 +2.5 % 16-MHz tolerance over temperature 0°C to 85°C 3V -3 ±2.0 +3 % 2.2 V 0.97 1 1.03 3V 0.975 1 1.025 3.6 V 0.97 1 1.03 2.2 V 7.76 8 8.4 3V 7.8 8 8.2 3.6 V 7.6 8 8.24 2.2 V 11.7 12 12.3 3V 11.7 12 12.3 3.6 V 11.7 12 12.3 3V 15.52 16 16.48 15 16 16.48 1-MHz calibration value 8-MHz calibration value 12-MHz calibration value 16-MHz calibration value TEST CONDITIONS BCSCTL1 = CALBC1_1MHZ, DCOCTL = CALDCO_1MHZ, Gating time: 5 ms 0°C to 85°C BCSCTL1 = CALBC1_8MHZ, DCOCTL = CALDCO_8MHZ, Gating time: 5 ms 0°C to 85°C BCSCTL1 = CALBC1_12MHZ, DCOCTL = CALDCO_12MHZ, Gating time: 5 ms 0°C to 85°C BCSCTL1 = CALBC1_16MHZ, DCOCTL = CALDCO_16MHZ, Gating time: 2 ms 0°C to 85°C Submit Documentation Feedback 3.6 V MIN TYP MHz MHz MHz MHz Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Calibrated DCO Frequencies - Tolerance Over Supply Voltage VCC over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS TA VCC MIN TYP MAX 1-MHz tolerance over VCC 25°C 8-MHz tolerance over VCC 25°C 12-MHz tolerance over VCC 16-MHz tolerance over VCC UNIT 1.8 V to 3.6 V -3 ±2 +3 % 1.8 V to 3.6 V -3 ±2 +3 % 25°C 2.2 V to 3.6 V -3 ±2 +3 % 25°C 3 V to 3.6 V -6 ±2 +3 % fCAL(1MHz) 1-MHz calibration value BCSCTL1 = CALBC1_1MHZ, DCOCTL = CALDCO_1MHZ, Gating time: 5 ms 25°C 1.8 V to 3.6 V 0.97 1 1.03 MHz fCAL(8MHz) 8-MHz calibration value BCSCTL1 = CALBC1_8MHZ, DCOCTL = CALDCO_8MHZ, Gating time: 5 ms 25°C 1.8 V to 3.6 V 7.76 8 8.24 MHz fCAL(12MHz) 12-MHz calibration value BCSCTL1 = CALBC1_12MHZ, DCOCTL = CALDCO_12MHZ, Gating time: 5 ms 25°C 2.2 V to 3.6 V 11.64 12 12.36 MHz fCAL(16MHz) 16-MHz calibration value BCSCTL1 = CALBC1_16MHZ, DCOCTL = CALDCO_16MHZ, Gating time: 2 ms 25°C 3 V to 3.6 V 15 16 16.48 MHz MIN TYP MAX UNIT Calibrated DCO Frequencies - Overall Tolerance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS TA VCC 1-MHz tolerance overall -40°C to 105°C 1.8 V to 3.6 V -5 ±2 +5 % 8-MHz tolerance overall -40°C to 105°C 1.8 V to 3.6 V -5 ±2 +5 % 12-MHz tolerance overall -40°C to 105°C 2.2 V to 3.6 V -5 ±2 +5 % 16-MHz tolerance overall -40°C to 105°C 3 V to 3.6 V -6 ±3 +6 % fCAL(1MHz) BCSCTL1 = CALBC1_1MHZ, 1-MHz DCOCTL = CALDCO_1MHZ, calibration value Gating time: 5 ms -40°C to 105°C 1.8 V to 3.6 V 0.95 1 1.05 MHz fCAL(8MHz) BCSCTL1 = CALBC1_8MHZ, 8-MHz DCOCTL = CALDCO_8MHZ, calibration value Gating time: 5 ms -40°C to 105°C 1.8 V to 3.6 V 7.6 8 8.4 MHz fCAL(12MHz) BCSCTL1 = CALBC1_12MHZ, 12-MHz DCOCTL = CALDCO_12MHZ, calibration value Gating time: 5 ms -40°C to 105°C 2.2 V to 3.6 V 11.4 12 12.6 MHz fCAL(16MHz) BCSCTL1 = CALBC1_16MHZ, 16-MHz DCOCTL = CALDCO_16MHZ, calibration value Gating time: 2 ms -40°C to 105°C 3 V to 3.6 V 15 16 17 MHz Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 29 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Typical Characteristics - Calibrated 1-MHz DCO Frequency CALIBRATED 1-MHz FREQUENCY vs TEMPERATURE CALIBRATED 1-MHz FREQUENCY vs SUPPLY VOLTAGE 1.03 1.03 1.02 1.02 Frequency − MHz 1.00 VCC = 2.2 V VCC = 3.0 V 0.99 Frequency − MHz VCC = 1.8 V 1.01 TA = 105 °C 1.01 TA = 85 °C 1.00 TA = 25 °C 0.99 TA = −40 °C VCC = 3.6 V 0.98 0.98 0.97 −50.0 −25.0 0.0 25.0 50.0 75.0 100.0 0.97 1.5 30 2.0 2.5 3.0 3.5 4.0 VCC − Supply Voltage − V Figure 12. TA − Temperature − °C Figure 11. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Wake-Up From Lower-Power Modes (LPM3/4) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS VCC MIN TYP BCSCTL1 = CALBC1_1MHZ, DCOCTL = CALDCO_1MHZ tDCO,LPM3/4 BCSCTL1 = CALBC1_8MHZ, DCO clock wake-up time DCOCTL = CALDCO_8MHZ from LPM3/4 (1) BCSCTL1 = CALBC1_12MHZ, DCOCTL = CALDCO_12MHZ (1) (2) UNIT 2 2.2 V, 3 V 1.5 µs 1 BCSCTL1 = CALBC1_16MHZ, DCOCTL = CALDCO_16MHZ tCPU,LPM3/4 MAX 3V 1 CPU wake-up time from LPM3/4 (2) 1 / fMCLK + tClock,LPM3/4 The DCO clock wake-up time is measured from the edge of an external wake-up signal (for example, a port interrupt) to the first clock edge observable externally on a clock pin (MCLK or SMCLK). Parameter applicable only if DCOCLK is used for MCLK. Typical Characteristics - DCO Clock Wake-Up Time From LPM3/4 CLOCK WAKE-UP TIME FROM LPM3 vs DCO FREQUENCY DCO Wake-Up Time − µs 10.00 RSELx = 0...11 RSELx = 12...15 1.00 0.10 0.10 1.00 10.00 DCO Frequency − MHz Figure 13. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 31 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com DCO With External Resistor ROSC (1) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS fDCO,ROSC DCO output frequency with ROSC DCOR = 1, RSELx = 4, DCOx = 3, MODx = 0, TA = 25°C DT Temperature drift DV Drift with VCC (1) VCC MIN TYP MAX UNIT 2.2 V 1.8 3V 1.95 DCOR = 1, RSELx = 4, DCOx = 3, MODx = 0 2.2 V, 3 V ±0.1 %/°C DCOR = 1, RSELx = 4, DCOx = 3, MODx = 0 2.2 V, 3 V 10 %/V MHz ROSC = 100 kΩ. Metal film resistor, type 0257, 0.6 W with 1% tolerance and TK = ±50 ppm/°C. Typical Characteristics - DCO With External Resistor ROSC DCO FREQUENCY vs ROSC VCC = 2.2 V, TA = 25°C DCO FREQUENCY vs ROSC VCC = 3 V, TA = 25°C 10.00 DCO Frequency − MHz DCO Frequency − MHz 10.00 1.00 0.10 RSELx = 4 0.01 10.00 100.00 1000.00 RSELx = 4 1000.00 10000.00 ROSC − External Resistor − kW Figure 15. DCO FREQUENCY vs TEMPERATURE VCC = 3 V DCO FREQUENCY vs SUPPLY VOLTAGE TA = 25°C 2.50 2.25 1.75 1.50 1.25 1.00 ROSC = 270k 0.75 DCO Frequency − MHz ROSC = 100k 2.00 ROSC = 100k 2.00 1.75 1.50 1.25 1.00 ROSC = 270k 0.75 0.50 0.50 ROSC = 1M 0.25 −25.0 0.0 25.0 50.0 75.0 ROSC = 1M 0.25 100.0 0.00 2.0 2.5 3.0 3.5 4.0 VCC − Supply Voltage − V Figure 17. TA − Temperature − C Figure 16. 32 100.00 ROSC − External Resistor − kW Figure 14. 2.25 DCO Frequency − MHz 0.10 0.01 10.00 10000.00 2.50 0.00 −50.0 1.00 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Crystal Oscillator LFXT1, Low-Frequency Mode (1) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS fLFXT1,LF LFXT1 oscillator crystal frequency, LF mode 0, 1 fLFXT1,LF,logic LFXT1 oscillator logic level square wave input frequency, XTS = 0, LFXT1Sx = 3 LF mode OALF Oscillation allowance for LF crystals CL,eff fFault,LF (1) (2) (3) (4) Integrated effective load capacitance, LF mode (2) XTS = 0, LFXT1Sx = 0 or 1 VCC MIN TYP 1.8 V to 3.6 V 1.8 V to 3.6 V MAX 32768 10000 32768 XTS = 0, LFXT1Sx = 0, fLFXT1,LF = 32768 Hz, CL,eff = 6 pF 500 XTS = 0, LFXT1Sx = 0, fLFXT1,LF = 32768 Hz, CL,eff = 12 pF 200 UNIT Hz 50000 Hz kΩ XTS = 0, XCAPx = 0 1 XTS = 0, XCAPx = 1 5.5 XTS = 0, XCAPx = 2 8.5 XTS = 0, XCAPx = 3 11 Duty cycle, LF mode XTS = 0, Measured at P2.0/ACLK, fLFXT1,LF = 32768 Hz 2.2 V, 3 V 30 Oscillator fault frequency, LF mode (3) XTS = 0, LFXT1Sx = 3 (4) 2.2 V, 3 V 10 50 pF 70 % 10000 Hz To improve EMI on the XT1 oscillator, the following guidelines should be observed. (a) Keep the trace between the device and the crystal as short as possible. (b) Design a good ground plane around the oscillator pins. (c) Prevent crosstalk from other clock or data lines into oscillator pins XIN and XOUT. (d) Avoid running PCB traces underneath or adjacent to the XIN and XOUT pins. (e) Use assembly materials and praxis to avoid any parasitic load on the oscillator XIN and XOUT pins. (f) If conformal coating is used, ensure that it does not induce capacitive/resistive leakage between the oscillator pins. (g) Do not route the XOUT line to the JTAG header to support the serial programming adapter as shown in other documentation. This signal is no longer required for the serial programming adapter. Includes parasitic bond and package capacitance (approximately 2 pF per pin). Because the PCB adds additional capacitance, it is recommended to verify the correct load by measuring the ACLK frequency. For a correct setup, the effective load capacitance should always match the specification of the crystal that is used. Frequencies below the MIN specification set the fault flag. Frequencies above the MAX specification do not set the fault flag. Frequencies in between might set the flag. Measured with logic-level input frequency but also applies to operation with crystals. Internal Very-Low-Power Low-Frequency Oscillator (VLO) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TA -40°C to 85°C fVLO VLO frequency dfVLO/dT VLO frequency temperature drift dfVLO/dVCC VLO frequency supply voltage drift (1) (2) 105°C (1) (2) VCC 2.2 V, 3 V -40°C to 105°C 2.2 V, 3 V 25°C 1.8 V to 3.6 V MIN TYP MAX 4 12 20 22 UNIT kHz 0.5 %/°C 4 %/V Calculated using the box method: I version: [MAX(-40...85°C) - MIN(-40...85°C)]/MIN(-40...85°C)/[85°C - (-40°C)] T version: [MAX(-40...105°C) - MIN(-40...105°C)]/MIN(-40...105°C)/[105°C - (-40°C)] Calculated using the box method: [MAX(1.8...3.6 V) - MIN(1.8...3.6 V)]/MIN(1.8...3.6 V)/(3.6 V - 1.8 V) Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 33 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Crystal Oscillator LFXT1, High-Frequency Mode (1) PARAMETER VCC MIN XTS = 1, LFXT1Sx = 0 1.8 V to 3.6 V LFXT1 oscillator crystal frequency, HF mode 1 XTS = 1, LFXT1Sx = 1 LFXT1 oscillator crystal frequency, HF mode 2 XTS = 1, LFXT1Sx = 2 fLFXT1,HF0 LFXT1 oscillator crystal frequency, HF mode 0 fLFXT1,HF1 fLFXT1,HF2 TEST CONDITIONS MAX UNIT 0.4 1 MHz 1.8 V to 3.6 V 1 4 MHz 1.8 V to 3.6 V 2 10 2.2 V to 3.6 V 2 12 3 V to 3.6 V fLFXT1,HF,logic OAHF CL,eff LFXT1 oscillator logic-level square-wave input frequency, HF XTS = 1, LFXT1Sx = 3 mode Oscillation allowance for HF crystals (see Figure 18 and Figure 19) Integrated effective load capacitance, HF mode (2) Duty cycle, HF mode fFault,HF (1) (2) (3) (4) (5) 34 Oscillator fault frequency (4) TYP 2 16 1.8 V to 3.6 V 0.4 10 2.2 V to 3.6 V 0.4 12 3 V to 3.6 V 0.4 16 XTS = 1, LFXT1Sx = 0, fLFXT1,HF = 1 MHz, CL,eff = 15 pF 2700 XTS = 1, LFXT1Sx = 1, fLFXT1,HF = 4 MHz, CL,eff = 15 pF 800 XTS = 1, LFXT1Sx = 2, fLFXT1,HF = 16 MHz, CL,eff = 15 pF 300 XTS = 1 (3) XTS = 1, Measured at P2.0/ACLK, fLFXT1,HF = 10 MHz XTS = 1, Measured at P2.0/ACLK, fLFXT1,HF = 16 MHz XTS = 1, LFXT1Sx = 3 (5) 50 pF 60 2.2 V, 3 V % 40 2.2 V, 3 V MHz Ω 1 40 MHz 30 50 60 300 kHz To improve EMI on the XT1 oscillator the following guidelines should be observed: (a) Keep the trace between the device and the crystal as short as possible. (b) Design a good ground plane around the oscillator pins. (c) Prevent crosstalk from other clock or data lines into oscillator pins XIN and XOUT. (d) Avoid running PCB traces underneath or adjacent to the XIN and XOUT pins. (e) Use assembly materials and praxis to avoid any parasitic load on the oscillator XIN and XOUT pins. (f) If conformal coating is used, ensure that it does not induce capacitive/resistive leakage between the oscillator pins. (g) Do not route the XOUT line to the JTAG header to support the serial programming adapter as shown in other documentation. This signal is no longer required for the serial programming adapter. Includes parasitic bond and package capacitance (approximately 2 pF per pin). Because the PCB adds additional capacitance, it is recommended to verify the correct load by measuring the ACLK frequency. For a correct setup, the effective load capacitance should always match the specification of the used crystal. Requires external capacitors at both terminals. Values are specified by crystal manufacturers. Frequencies below the MIN specification set the fault flag, frequencies above the MAX specification do not set the fault flag, and frequencies in between might set the flag. Measured with logic-level input frequency, but also applies to operation with crystals. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Typical Characteristics - LFXT1 Oscillator in HF Mode (XTS = 1) OSCILLATION ALLOWANCE vs CRYSTAL FREQUENCY CL,eff = 15 pF, TA = 25°C OSCILLATOR SUPPLY CURRENT vs CRYSTAL FREQUENCY CL,eff = 15 pF, TA = 25°C 800.0 100000.00 LFXT1Sx = 3 10000.00 1000.00 LFXT1Sx = 3 100.00 LFXT1Sx = 1 LFXT1Sx = 2 XT Oscillator Supply Current − uA Oscillation Allowance − Ohms 700.0 600.0 500.0 400.0 300.0 LFXT1Sx = 2 200.0 100.0 LFXT1Sx = 1 10.00 0.10 1.00 10.00 100.00 0.0 0.0 Crystal Frequency − MHz 4.0 8.0 12.0 16.0 20.0 Crystal Frequency − MHz Figure 19. Figure 18. Timer_A over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS fTA Timer_A clock frequency Internal: SMCLK, ACLK External: TACLK, INCLK Duty cycle = 50% ± 10% tTA,cap Timer_A capture timing TA0, TA1, TA2 VCC MIN TYP MAX 2.2 V 10 3V 16 2.2 V, 3 V 20 UNIT MHz ns Timer_B over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS fTB Timer_B clock frequency Internal: SMCLK, ACLK External: TACLK, INCLK Duty cycle = 50% ± 10% tTB,cap Timer_B capture timing TB0, TB1, TB2 VCC MIN TYP MAX 2.2 V 10 3V 16 2.2 V, 3 V 20 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 UNIT MHz ns 35 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com USCI (UART Mode) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER fUSCI USCI input clock frequency fBITCLK BITCLK clock frequency (equals baud rate in MBaud) tτ UART receive deglitch time (1) (1) CONDITIONS VCC MIN TYP Internal: SMCLK, ACLK External: UCLK Duty cycle = 50% ± 10% 2.2 V, 3 V MAX UNIT fSYSTEM MHz 1 MHz 2.2 V 50 150 600 3V 50 100 600 ns Pulses on the UART receive input (UCxRX) shorter than the UART receive deglitch time are suppressed. To ensure that pulses are correctly recognized their width should exceed the maximum specification of the deglitch time. USCI (SPI Master Mode) (1) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 20 and Figure 21) PARAMETER fUSCI USCI input clock frequency tSU,MI SOMI input data setup time tHD,MI SOMI input data hold time tVALID,MO SIMO output data valid time (1) TEST CONDITIONS VCC MIN TYP SMCLK, ACLK Duty cycle = 50% ± 10% UCLK edge to SIMO valid, CL = 20 pF 2.2 V 110 3V 75 2.2 V 0 3V 0 MAX UNIT fSYSTEM MHz ns ns 2.2 V 30 3V 20 ns fUCxCLK = 1/2tLO/HI with tLO/HI ≥ max(tVALID,MO(USCI) + tSU,SI(Slave), tSU,MI(USCI) + tVALID,SO(Slave)). For the slave's parameters tSU,SI(Slave) and tVALID,SO(Slave), see the SPI parameters of the attached slave. USCI (SPI Slave Mode) (1) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 22 and Figure 23) PARAMETER TEST CONDITIONS VCC MIN TYP MAX tSTE,LEAD STE lead time, STE low to clock 2.2 V, 3 V tSTE,LAG STE lag time, Last clock to STE high 2.2 V, 3 V tSTE,ACC STE access time, STE low to SOMI data out 2.2 V, 3 V 50 ns tSTE,DIS STE disable time, STE high to SOMI high impedance 2.2 V, 3 V 50 ns tSU,SI SIMO input data setup time tHD,SI SIMO input data hold time tVALID,SO SOMI output data valid time (1) 36 UCLK edge to SOMI valid, CL = 20 pF 50 UNIT ns 10 2.2 V 20 3V 15 2.2 V 10 3V 10 ns ns ns 2.2 V 75 110 3V 50 75 ns fUCxCLK = 1/2tLO/HI with tLO/HI ≥ max(tVALID,MO(Master) + tSU,SI(USCI), tSU,MI(Master) + tVALID,SO(USCI)). For the master's parameters tSU,MI(Master) and tVALID,MO(Master), see the SPI parameters of the attached slave. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 1/fUCxCLK CKPL=0 UCLK CKPL=1 tLO/HI tLO/HI tSU,MI tHD,MI SOMI tVALID,MO SIMO Figure 20. SPI Master Mode, CKPH = 0 1/fUCxCLK CKPL=0 UCLK CKPL=1 tLO/HI tLO/HI tSU,MI tHD,MI SOMI tVALID,MO SIMO Figure 21. SPI Master Mode, CKPH = 1 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 37 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com tSTE,LEAD tSTE,LAG STE 1/fUCxCLK CKPL=0 UCLK CKPL=1 tLO/HI tLO/HI tSU,SI tHD,SI SIMO tSTE,ACC tVALID,SO tSTE,DIS SOMI Figure 22. SPI Slave Mode, CKPH = 0 tSTE,LEAD tSTE,LAG STE 1/fUCxCLK CKPL=0 UCLK CKPL=1 tLO/HI tLO/HI tSU,SI tHD,SI SIMO tSTE,ACC tVALID,SO tSTE,DIS SOMI Figure 23. SPI Slave Mode, CKPH = 1 38 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 USCI (I2C Mode) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 24) PARAMETER TEST CONDITIONS VCC MIN TYP Internal: SMCLK, ACLK External: UCLK Duty cycle = 50% ± 10% MAX UNIT fSYSTEM MHz 400 kHz fUSCI USCI input clock frequency fSCL SCL clock frequency tHD,STA Hold time (repeated) START tSU,STA Setup time for a repeated START tHD,DAT Data hold time 2.2 V, 3 V 0 tSU,DAT Data setup time 2.2 V, 3 V 250 ns tSU,STO Setup time for STOP 2.2 V, 3 V 4 µs tSP Pulse width of spikes suppressed by input filter 2.2 V 50 150 600 3V 50 100 600 2.2 V, 3 V fSCL ≤ 100 kHz fSCL > 100 kHz fSCL ≤ 100 kHz fSCL > 100 kHz tHD,STA 2.2 V, 3 V 2.2 V, 3 V 0 4 µs 0.6 4.7 µs 0.6 ns ns tSU,STA tHD,STA SDA 1/fSCL tSP SCL tSU,DAT tSU,STO tHD,DAT Figure 24. I2C Mode Timing Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 39 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com 10-Bit ADC, Power Supply and Input Range Conditions (1) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (1) PARAMETER TEST CONDITIONS VCC Analog supply voltage range VSS = 0 V VAx Analog input voltage range (2) All Ax terminals, Analog inputs selected in ADC10AE register ADC10 supply current (3) fADC10CLK = 5 MHz, ADC10ON = 1, REFON = 0, ADC10SHT0 = 1, ADC10SHT1 = 0, ADC10DIV = 0 IADC10 IREF+ Reference supply current, reference buffer disabled (4) fADC10CLK = 5 MHz, ADC10ON = 0, REF2_5V = 0, REFON = 1, REFOUT = 0 fADC10CLK = 5 MHz, ADC10ON = 0, REF2_5V = 1, REFON = 1, REFOUT = 0 TA -40°C to 105°C VCC MAX UNIT 2.2 3.6 V 0 VCC V 0.52 1.05 3V 0.6 1.2 2.2 V, 3 V 0.25 0.4 -40°C to 105°C mA mA 3V 0.25 0.4 1.1 1.4 fADC10CLK = 5 MHz ADC10ON = 0, REFON = 1, REF2_5V = 0, REFOUT = 1, ADC10SR = 0 -40°C to 85°C 2.2 V, 3 V 105°C 2.2 V, 3 V Reference buffer supply IREFB,1 current with ADC10SR = 1 (4) fADC10CLK = 5 MHz, ADC10ON = 0, REFON = 1, REF2_5V = 0, REFOUT = 1, ADC10SR = 1 -40°C to 85°C 2.2 V, 3 V 105°C 2.2 V, 3 V CI Input capacitance Only one terminal Ax selected at a time -40°C to 105°C RI Input MUX ON resistance 0 V ≤ VAx ≤ VCC -40°C to 105°C 40 TYP 2.2 V Reference buffer supply IREFB,0 current with ADC10SR = 0 (4) (1) (2) (3) (4) MIN 2.2 V, 3 V 1.8 0.5 mA 0.7 0.8 mA 27 pF 2000 Ω The leakage current is defined in the leakage current table with Px.x/Ax parameter. The analog input voltage range must be within the selected reference voltage range VR+ to VR- for valid conversion results. The internal reference supply current is not included in current consumption parameter IADC10. The internal reference current is supplied via terminal VCC. Consumption is independent of the ADC10ON control bit, unless a conversion is active. The REFON bit enables the built-in reference to settle before starting an A/D conversion. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 10-Bit ADC, Built-In Voltage Reference over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VCC,REF+ TEST CONDITIONS VCC MIN IVREF+ ≤ 1 mA, REF2_5V = 0 Positive built-in reference analog IVREF+ ≤ 0.5 mA, REF2_5V = 1 supply voltage range IVREF+ ≤ 1 mA, REF2_5V = 1 VREF+ Positive built-in reference voltage ILD,VREF+ Maximum VREF+ load current VREF+ load regulation TYP MAX UNIT 2.2 2.8 V 2.9 IVREF+ ≤ IVREF+max, REF2_5V = 0 2.2 V, 3 V 1.41 1.5 1.59 IVREF+ ≤ IVREF+max, REF2_5V = 1 3V 2.35 2.5 2.65 2.2 V V ±0.5 3V ±1 IVREF+ = 500 µA ± 100 µA, Analog input voltage VAx ≈ 0.75 V, REF2_5V = 0 2.2 V, 3 V ±2 IVREF+ = 500 µA ± 100 µA, Analog input voltage VAx ≈ 1.25 V, REF2_5V = 1 3V mA LSB ±2 VREF+ load regulation response time IVREF+ = 100 µA to 900 µA, VAx ≈ 0.5 x VREF+, Error of conversion result ≤1 LSB CVREF+ Maximum capacitance at pin VREF+ (1) IVREF+ ≤ ±1 mA, REFON = 1, REFOUT = 1 2.2 V, 3 V 100 pF TCREF+ Temperature coefficient IVREF+ = constant with 0 mA ≤ IVREF+ ≤ 1 mA 2.2 V, 3 V ±100 ppm/°C tREFON Settling time of internal reference voltage (2) IVREF+ = 0.5 mA, REF2_5V = 0, REFON = 0 to 1 tREFBURST (1) (2) Settling time of reference buffer (2) ADC10SR = 0 ADC10SR = 1 IVREF+ = 0.5 mA, REF2_5V = 0, REFON = 1, REFBURST = 1 ADC10SR = 0 IVREF+ = 0.5 mA, REF2_5V = 1, REFON = 1, REFBURST = 1 ADC10SR = 0 ADC10SR = 1 ADC10SR = 1 400 3V 3.6 V ns 2000 30 µs 1 2.2 V 2.5 2 3V µs 4.5 The capacitance applied to the internal buffer operational amplifier, if switched to terminal P2.4/TA 2/A4/VREF+/ VeREF+ (REFOUT = 1), must be limited; the reference buffer may become unstable otherwise. The condition is that the error in a conversion started after tREFON or tRefBuf is less than ±0.5 LSB. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 41 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com 10-Bit ADC, External Reference (1) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS Positive external reference input voltage range (2) VeREF+ MIN MAX VeREF+ > VeREF-, SREF1 = 1, SREF0 = 0 1.4 VCC VeREF- ≤ VeREF+ ≤ VCC - 0.15 V, SREF1 = 1, SREF0 = 1 (3) 1.4 3 0 1.2 V 1.4 VCC V VeREF- Negative external reference input voltage range (4) VeREF+ > VeREF- ΔVeREF Differential external reference input voltage range ΔVeREF = VeREF+ - VeREF- VeREF+ > VeREF- (5) IVeREF+ Static input current into VeREF+ IVeREF(1) (2) (3) (4) (5) Static input current into VeREF- 0 V ≤ VeREF+ ≤ VCC, SREF1 = 1, SREF0 = 0 VCC UNIT V ±1 0 V ≤ VeREF+ ≤ VCC - 0.15 V ≤ 3 V, SREF1 = 1, SREF0 = 1 (3) 0 V ≤ VeREF- ≤ VCC 2.2 V, 3 V µA 0 2.2 V, 3 V ±1 µA The external reference is used during conversion to charge and discharge the capacitance array. The input capacitance, CI, is also the dynamic load for an external reference during conversion. The dynamic impedance of the reference supply should follow the recommendations on analog-source impedance to allow the charge to settle for 10-bit accuracy. The accuracy limits the minimum positive external reference voltage. Lower reference voltage levels may be applied with reduced accuracy requirements. Under this condition, the external reference is internally buffered. The reference buffer is active and requires the reference buffer supply current IREFB. The current consumption can be limited to the sample and conversion period with REBURST = 1. The accuracy limits the maximum negative external reference voltage. Higher reference voltage levels may be applied with reduced accuracy requirements. The accuracy limits the minimum external differential reference voltage. Lower differential reference voltage levels may be applied with reduced accuracy requirements. 10-Bit ADC, Timing Parameters over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS ADC10SR = 0 fADC10CLK ADC10 input clock frequency For specified performance of ADC10 linearity parameters fADC10OSC ADC10 built-in oscillator frequency ADC10DIVx = 0, ADC10SSELx = 0, fADC10CLK = fADC10OSC ADC10 built-in oscillator, ADC10SSELx = 0, fADC10CLK = fADC10OSC tCONVERT Conversion time tADC10ON Turn on settling time of the ADC (1) (1) 42 ADC10SR = 1 fADC10CLK from ACLK, MCLK or SMCLK, ADC10SSELx ≠ 0 VCC MIN TYP MAX 0.45 6.3 0.45 1.5 2.2 V, 3 V 3.7 6.3 2.2 V, 3 V 2.06 3.51 2.2 V, 3 V 13 × ADC10DIVx × 1 / fADC10CLK 100 UNIT MHz MHz µs ns The condition is that the error in a conversion started after tADC10ON is less than ±0.5 LSB. The reference and input signal are already settled. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 10-Bit ADC, Linearity Parameters over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS VCC MIN TYP MAX UNIT EI Integral linearity error 2.2 V, 3 V ±1 LSB ED Differential linearity error 2.2 V, 3 V ±1 LSB EO Offset error 2.2 V, 3 V ±1 LSB EG Gain error ET (1) Total unadjusted error Source impedance RS < 100 Ω SREFx = 010, unbuffered external reference, VeREF+ = 1.5 V 2.2 V ±1.1 ±2 SREFx = 010, unbuffered external reference, VeREF+ = 2.5 V 3V ±1.1 ±2 SREFx = 011, buffered external reference (1), VeREF+ = 1.5 V 2.2 V ±1.1 ±4 SREFx = 011, buffered external reference (1), VeREF+ = 2.5 V 3V ±1.1 ±3 SREFx = 010, unbuffered external reference, VeREF+ = 1.5 V 2.2 V ±2 ±5 SREFx = 010, unbuffered external reference, VeREF+ = 2.5 V 3V ±2 ±5 SREFx = 011, buffered external reference (1), VeREF+ = 1.5 V 2.2 V ±2 ±7 SREFx = 011, buffered external reference (1), VeREF+ = 2.5 V 3V ±2 ±6 TYP MAX 2.2 V 40 120 3V 60 160 LSB LSB The reference buffer offset adds to the gain and total unadjusted error. 10-Bit ADC, Temperature Sensor and Built-In VMID (1) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER ISENSOR Temperature sensor supply current (1) REFON = 0, INCHx = 0Ah, TA = 25°C ADC10ON = 1, INCHx = 0Ah (2) TCSENSOR VOffset,Sensor TEST CONDITIONS Sensor offset voltage ADC10ON = 1, INCHx = 0Ah VCC 2.2 V, 3 V (2) Sensor output voltage (3) 3.44 3.55 -100 Temperature sensor voltage at TA = 105°C (T version only) VSENSOR MIN 100 1365 1465 1195 1295 1395 Temperature sensor voltage at TA = 25°C 985 1085 1185 Temperature sensor voltage at TA = 0°C 895 995 1095 2.2 V, 3 V tSENSOR(sample) Sample time required if channel 10 is selected (4) ADC10ON = 1, INCHx = 0Ah, Error of conversion result ≤ 1 LSB IVMID Current into divider at channel 11 (4) ADC10ON = 1, INCHx = 0Bh VMID VCC divider at channel 11 ADC10ON = 1, INCHx = 0Bh, VMID ≈ 0.5 × VCC 2.2 V 1.06 1.1 1.14 3V 1.46 1.5 1.54 tVMID(sample) Sample time required if channel 11 is selected (5) ADC10ON = 1, INCHx = 0Bh, Error of conversion result ≤ 1 LSB 2.2 V 1400 3V 1220 (1) (2) (3) (4) (5) 2.2 V, 3 V µA 3.66 mV/°C 1265 Temperature sensor voltage at TA = 85°C UNIT 30 mV mV µs 2.2 V N/A 3V N/A µA V ns The sensor current ISENSOR is consumed if (ADC10ON = 1 and REFON = 1), or (ADC10ON = 1 and INCH = 0Ah and sample signal is high).When REFON = 1, ISENSOR is included in IREF+.When REFON = 0, ISENSOR applies during conversion of the temperature sensor input (INCH = 0Ah). The following formula can be used to calculate the temperature sensor output voltage: VSensor,typ = TCSensor ( 273 + T [°C] ) + VOffset,sensor [mV] or VSensor,typ = TCSensor T [°C] + VSensor(TA = 0°C) [mV] Results based on characterization and/or production test, not TCSensor or VOffset,sensor. No additional current is needed. The VMID is used during sampling. The on time, tVMID(on), is included in the sampling time, tVMID(sample); no additional on time is needed. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 43 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Flash Memory over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS VCC MIN TYP MAX UNIT VCC (PGM/ERASE) Program and erase supply voltage 2.2 3.6 V fFTG Flash timing generator frequency 257 476 kHz IPGM Supply current from VCC during program 2.2 V, 3.6 V 1 5 mA IERASE Supply current from VCC during erase 2.2 V, 3.6 V 1 7 mA 10 ms (1) tCPT Cumulative program time tCMErase Cumulative mass erase time 2.2 V, 3.6 V 2.2 V, 3.6 V 20 104 Program/Erase endurance ms 105 cycles tRetention Data retention duration TJ = 25°C tWord Word or byte program time (2) 30 tFTG tBlock, Block program time for first byte or word (2) 25 tFTG Block program time for each additional byte or word (2) 18 tFTG Block program end-sequence wait time (2) 6 tFTG Mass erase time (2) 10593 tFTG Segment erase time (2) 4819 tFTG 0 tBlock, 1-63 tBlock, End tMass Erase tSeg (1) (2) Erase 15 years The cumulative program time must not be exceeded when writing to a 64-byte flash block. This parameter applies to all programming methods: individual word/byte write and block write modes. These values are hardwired into the flash controller's state machine (tFTG = 1/fFTG). RAM over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER V(RAMh) (1) 44 RAM retention supply voltage (1) TEST CONDITIONS CPU halted MIN MAX UNIT 1.6 V This parameter defines the minimum supply voltage VCC when the data in RAM remains unchanged. No program execution should happen during this supply voltage condition. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 JTAG and Spy-Bi-Wire Interface over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS VCC MIN TYP MAX UNIT fSBW Spy-Bi-Wire input frequency 2.2 V, 3 V 0 20 MHz tSBW,Low Spy-Bi-Wire low clock pulse length 2.2 V, 3 V 0.025 15 µs tSBW,En Spy-Bi-Wire enable time (TEST high to acceptance of first clock edge (1)) 2.2 V, 3 V 1 µs tSBW,Ret Spy-Bi-Wire return to normal operation time 2.2 V, 3 V 15 100 2.2 V 0 5 MHz 3V 0 10 MHz 2.2 V, 3 V 25 90 kΩ fTCK TCK input frequency (2) RInternal Internal pulldown resistance on TEST (1) (2) 60 µs Tools accessing the Spy-Bi-Wire interface need to wait for the maximum tSBW,En time after pulling the TEST/SBWCLK pin high before applying the first SBWCLK clock edge. fTCK may be restricted to meet the timing requirements of the module selected. JTAG Fuse (1) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS VCC(FB) Supply voltage during fuse-blow condition VFB Voltage level on TEST for fuse blow IFB Supply current into TEST during fuse blow tFB Time to blow fuse (1) TA = 25°C MIN MAX 2.5 6 UNIT V 7 V 100 mA 1 ms Once the fuse is blown, no further access to the JTAG/Test, Spy-Bi-Wire, and emulation feature is possible, and JTAG is switched to bypass mode. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 45 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Application Information Port P1 Pin Schematic: P1.0 to P1.3, Input/Output With Schmitt Trigger Pad Logic P1REN.x P1DIR.x 0 0 Module X OUT 1 0 DVCC 1 1 Direction 0: Input 1: Output 1 P1OUT.x DVSS P1.0/TACLK/ADC10CLK P1.1/TA0 P1.2/TA1 P1.3/TA2 P1SEL.x P1IN.x EN Module X IN D P1IE.x P1IRQ.x EN Q Set P1IFG.x Interrupt Edge Select P1SEL.x P1IES.x Table 16. Port P1 (P1.0 to P1.3) Pin Functions PIN NAME (P1.x) x FUNCTION P1DIR.x P1SEL.x I: 0; O: 1 0 0 1 ADC10CLK 1 1 P1.1 (1) (I/O) I: 0; O: 1 0 0 1 P1.0 (1) P1.0/TACLK/ADC10CLK P1.1/TA0 0 1 Timer_A3.TACLK Timer_A3.CCI0A Timer_A3.TA0 1 1 I: 0; O: 1 0 Timer_A3.CCI1A 0 1 Timer_A3.TA1 1 1 P1.2 (1) (I/O) P1.2/TA1 2 P1.3 P1.3/TA2 (1) 46 3 CONTROL BITS/SIGNALS (1) I: 0; O: 1 0 Timer_A3.CCI2A (I/O) 0 1 Timer_A3.TA2 1 1 Default after reset (PUC/POR) Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Port P1 Pin Schematic: P1.4 to P1.6, Input/Output With Schmitt Trigger and In-System Access Features Pad Logic P1REN.x P1DIR.x 0 P1OUT.x 0 1 0 DVCC 1 1 Direction 0: Input 1: Output 1 Module X OUT DVSS P1.4/SMCLK/TCK P1.5/TA0/TMS P1.6/TA1/TDI Bus Keeper P1SEL.x EN P1IN.x EN Module X IN D P1IE.x P1IRQ.x EN Q P1IFG.x P1SEL.x P1IES.x Set Interrupt Edge Select To JTAG From JTAG Table 17. Port P1 (P1.4 to P1.6) Pin Functions PIN NAME (P1.x) x FUNCTION P1.4 P1.4/SMCLK/TCK 4 (2) (I/O) 5 (1) (2) (3) 6 P1SEL.x 4-Wire JTAG I: 0; O: 1 0 0 1 1 0 TCK X X 1 I: 0; O: 1 0 0 Timer_A3.TA0 1 1 0 TMS X X 1 I: 0; O: 1 0 0 P1.6 (2) (I/O) P1.6/TA1/TDI/TCLK P1DIR.x SMCLK P1.5 (2) (I/O) P1.5/TA0/TMS CONTROL BITS/SIGNALS (1) Timer_A3.TA1 1 1 0 TDI/TCLK (3) X X 1 X = Don't care Default after reset (PUC/POR) Function controlled by JTAG Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 47 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Port P1 Pin Schematic: P1.7, Input/Output With Schmitt Trigger and In-System Access Features Pad Logic P1REN.7 P1DIR.7 0 0 Module X OUT 1 0 1 1 Direction 0: Input 1: Output 1 P1OUT.7 DVSS DVCC P1.7/TA2/TDO/TDI Bus Keeper P1SEL.7 EN P1IN.7 EN Module X IN D P1IE.7 P1IRQ.7 EN Q P1IFG.7 Set Interrupt Edge Select P1SEL.7 P1IES.7 To JTAG From JTAG From JTAG From JTAG (TDO) Table 18. Port P1 (P1.7) Pin Functions PIN NAME (P1.x) x FUNCTION P1.7 (2) (I/O) P1.7/TA2/TDO/TDI 7 Timer_A3.TA2 TDO/TDI (1) (2) (3) 48 (3) CONTROL BITS/SIGNALS (1) P1DIR.x P1SEL.x 4-Wire JTAG I: 0; O: 1 0 0 1 1 0 X X 1 X = Don't care Default after reset (PUC/POR) Function controlled by JTAG Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Port P2 Pin Schematic: P2.0, P2.2, Input/Output With Schmitt Trigger Pad Logic To ADC 10 INCHx = y ADC10AE0.y P2REN.x P2DIR.x 0 0 Module X OUT 1 0 DVCC 1 1 Direction 0: Input 1: Output 1 P2OUT.x DVSS P2.0/ACLK/A0 P2.2/TA0/A2 Bus Keeper P2SEL.x EN P2IN.x EN Module X IN D P2IE.x P2IRQ.x EN Q P2IFG.x Set Interrupt Edge Select P2SEL.x P2IES.x Table 19. Port P2 (P2.0, P2.2) Pin Functions Pin Name (P2.x) x y FUNCTION P2.0 (2) (I/O) P2.0/ACLK/A0 0 0 ACLK A0 (3) P2.2 (2) (I/O) P2.2/TA0/A2 (1) (2) (3) 2 2 Timer_A3.CCI0B CONTROL BITS/SIGNALS (1) P2DIR.x P2SEL.x ADC10AE0.y I: 0; O: 1 0 0 1 1 0 X X 1 I: 0; O: 1 0 0 0 1 0 Timer_A3.TA0 1 1 0 A2 (3) X X 1 X = Don't care Default after reset (PUC/POR) Setting the ADC10AE0.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when applying analog signals. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 49 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Port P2 Pin Schematic: P2.1, Input/Output With Schmitt Trigger Pad Logic To ADC 10 INCHx = 1 ADC10AE0.1 P2REN.1 P2DIR.1 0 P2OUT.1 0 1 0 DVCC 1 1 Direction 0: Input 1: Output 1 Module X OUT DVSS P2.1/TAINCLK/SMCLK/A1 Bus Keeper P2SEL.1 EN P2IN.1 EN Module X IN D P2IE.1 P2IRQ.1 EN Q P2IFG.1 Set Interrupt Edge Select P2SEL.1 P2IES.1 Table 20. Port P2 (P2.1) Pin Functions PIN NAME (P2.x) x y FUNCTION P2.1 (2) (I/O) P2.1/TAINCLK/SMCLK/ A1 (1) (2) (3) 50 1 1 Timer_A3.INCLK CONTROL BITS/SIGNALS (1) P2DIR.x P2SEL.x ADC10AE0.y I: 0; O: 1 0 0 0 1 0 SMCLK 1 1 0 A1 (3) X X 1 X = Don't care Default after reset (PUC/POR) Setting the ADC10AE0.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when applying analog signals. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Port P2 Pin Schematic: P2.3, Input/Output With Schmitt Trigger SREF2 Pad Logic VSS 0 To ADC 10 VR− 1 To ADC 10 INCHx = 3 ADC10AE0.3 P2REN.3 P2DIR.3 0 0 Module X OUT 1 0 1 1 Direction 0: Input 1: Output 1 P2OUT.3 DVSS DVCC P2.3/TA1/ A3/VREF−/VeREF− Bus Keeper P2SEL.3 EN P2IN.3 EN Module X IN D P2IE.3 EN P2IRQ.3 Q Set P2IFG.3 Interrupt Edge Select P2SEL.3 P2IES.3 Table 21. Port P2 (P2.3) Pin Functions PIN NAME (P2.x) x y FUNCTION P2.3 P2.3/TA1/A3/VREF/VeREF- (1) (2) (3) 3 3 (2) (I/O) CONTROL BITS/SIGNALS (1) P2DIR.x P2SEL.x ADC10AE0.y I: 0; O: 1 0 0 Timer_A3.CCI1B 0 1 0 Timer_A3.TA1 1 1 0 A3/VREF-/VeREF- (3) X X 1 X = Don't care Default after reset (PUC/POR) Setting the ADC10AE0.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when applying analog signals. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 51 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Port P2 Pin Schematic: P2.4, Input/Output With Schmitt Trigger Pad Logic To /from ADC10 positive reference To ADC 10 INCHx = 4 ADC10AE0.4 P2REN.4 P2DIR.4 0 0 Module X OUT 1 0 DVCC 1 1 Direction 0: Input 1: Output 1 P2OUT.4 DVSS P2.4/TA2/ A4/VREF+/VeREF+ Bus Keeper P2SEL.4 EN P2IN.4 EN Module X IN D P2IE.4 P2IRQ.4 EN Q Set P2IFG.4 P2SEL.4 P2IES.4 Interrupt Edge Select Table 22. Port P2 (P2.4) Pin Functions PIN NAME (P2.x) x y FUNCTION P2.4 (2) (I/O) P2.4/TA2/A4/VREF+/ VeREF+ 4 4 Timer_A3.TA2 A4/VREF+/VeREF+ (1) (2) (3) 52 (3) CONTROL BITS/SIGNALS (1) P2DIR.x P2SEL.x ADC10AE0.y I: 0; O: 1 0 0 1 1 0 X X 1 X = Don't care Default after reset (PUC/POR) Setting the ADC10AE0.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when applying analog signals. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Port P2 Pin Schematic: P2.5, Input/Output With Schmitt Trigger and External ROSC for DCO Pad Logic To DCO DCOR P2REN.x P2DIR.x 0 0 Module X OUT 1 0 1 1 Direction 0: Input 1: Output 1 P2OUT.x DVSS DVCC P2.5/ROSC Bus Keeper P2SEL.x EN P2IN.x EN Module X IN D P2IE.x P2IRQ.x EN Q P2IFG.x P2SEL.x P2IES.x Set Interrupt Edge Select Table 23. Port P2 (P2.5) Pin Functions PIN NAME (P2.x) x FUNCTION P2.5 P2.5/ROSC (1) (2) (3) 5 (2) (I/O) CONTROL BITS/SIGNALS (1) P2DIR.x P2SEL.x DCOR I: 0; O: 1 0 0 N/A (3) 0 1 0 DVSS 1 1 0 ROSC X X 1 X = Don't care Default after reset (PUC/POR) N/A = Not available or not applicable Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 53 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Port P2 Pin Schematic: P2.6, Input/Output With Schmitt Trigger and Crystal Oscillator Input BCSCTL3.LFXT1Sx = 11 LFXT1 Oscillator P2.7/XOUT LFXT1 off 0 LFXT1CLK 1 Pad Logic P2SEL.7 P2REN.6 P2DIR.6 0 0 Module X OUT 1 0 1 1 Direction 0: Input 1: Output 1 P2OUT.6 DVSS DVCC P2.6/XIN Bus Keeper P2SEL.6 EN P2IN.6 EN Module X IN D P2IE.6 P2IRQ.6 EN Q P2IFG.6 P2SEL.6 P2IES.6 Set Interrupt Edge Select Table 24. Port P2 (P2.6) Pin Functions PIN NAME (P2.x) P2.6/XIN (1) (2) 54 x 6 FUNCTION P2.6 (I/O) XIN (2) CONTROL BITS/SIGNALS (1) P2DIR.x P2SEL.x I: 0; O: 1 0 X 1 X = Don't care Default after reset (PUC/POR) Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Port P2 Pin Schematic: P2.7, Input/Output With Schmitt Trigger and Crystal Oscillator Output BCSCTL3.LFXT1Sx = 11 LFXT1 Oscillator LFXT1 off 0 LFXT1CLK From P2.6/XIN 1 P2.6/XIN Pad Logic P2SEL.6 P2REN.7 P2DIR.7 0 0 Module X OUT 1 0 1 1 Direction 0: Input 1: Output 1 P2OUT.7 DVSS DVCC P2.7/XOUT Bus Keeper P2SEL.7 EN P2IN.7 EN Module X IN D P2IE.7 P2IRQ.7 EN Q P2IFG.7 P2SEL.7 P2IES.7 Set Interrupt Edge Select Table 25. Port P2 (P2.7) Pin Functions PIN NAME (P2.x) XOUT/P2.7 (1) (2) (3) x 7 FUNCTION CONTROL BITS/SIGNALS (1) P2DIR.x P2SEL.x P2.7 (I/O) I: 0; O: 1 0 XOUT (2) X 1 (3) X = Don't care Default after reset (PUC/POR) If the pin XOUT/P2.7 is used as an input a current can flow until P2SEL.7 is cleared due to the oscillator output driver connection to this pin after reset. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 55 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Port P3 Pin Schematic: P3.0, Input/Output With Schmitt Trigger Pad Logic To ADC 10 INCHx = 5 ADC10AE0.5 P3REN.0 P3DIR.0 USCI Direction Control 0 P3OUT.0 0 Module X OUT 1 DVSS 0 DVCC 1 1 Direction 0: Input 1: Output 1 P3.0/UCB0STE/UCA0CLK/A5 Bus Keeper P3SEL.0 EN P3IN.0 EN Module X IN D Table 26. Port P3 (P3.0) Pin Functions PIN NAME (P1.x) x y FUNCTION P3.0 (2) (I/O) P3.0/UCB0STE/ UCA0CLK/A5 0 5 UCB0STE/UCA0CLK (3) A5 (1) (2) (3) (4) (5) 56 (4) (5) CONTROL BITS/SIGNALS (1) P3DIR.x P3SEL.x ADC10AE0.y I: 0; O: 1 0 0 X 1 0 X X 1 X = Don't care Default after reset (PUC/POR) The pin direction is controlled by the USCI module. UCA0CLK function takes precedence over UCB0STE function. If the pin is required as UCA0CLK input or output, USCI_B0 is forced to 3-wire SPI mode if 4-wire SPI mode is selected. Setting the ADC10AE0.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when applying analog signals. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Port P3 Pin Schematic: P3.1 to P3.5, Input/Output With Schmitt Trigger Pad Logic DVSS P3REN.x P3DIR.x USCI Direction Control 0 P3OUT.x 0 Module X OUT 1 DVSS 0 DVCC 1 1 Direction 0: Input 1: Output 1 P3.1/UCB0SIMO/UCB0SDA P3.2/UCB0SOMI/UCB0SCL P3.3/UCB0CLK/UCA0STE P3.4/UCA0TXD/UCA0SIMO P3.5/UCA0RXD/UCA0SOMI Bus Keeper P3SEL.x EN P3IN.x EN Module X IN D Table 27. Port P3 (P3.1 to P3.5) Pin Functions PIN NAME (P3.x) P3.1/UCB0SIMO/UCB0SDA P3.2/UCB0SOMI/UCB0SCL P3.3/UCB0CLK/UCA0STE P3.4/UCA0TXD/UCA0SIMO P3.5/UCA0RXD/UCA0SOMI (1) (2) (3) (4) x 1 2 3 4 5 FUNCTION P3.1 (2) (I/O) UCB0SIMO/UCB0SDA (3) P3.2 (2) (I/O) UCB0SOMI/UCB0SCL (3) P3.3 (2) (I/O) UCB0CLK/UCA0STE (3) P3.4 (2) (4) (I/O) UCA0TXD/UCA0SIMO (3) P3.5 (2) (I/O) UCA0RXD/UCA0SOMI (3) CONTROL BITS/SIGNALS (1) P3DIR.x P3SEL.x I: 0; O: 1 0 X 1 I: 0; O: 1 0 X 1 I: 0; O: 1 0 X 1 I: 0; O: 1 0 X 1 I: 0; O: 1 0 X 1 X = Don't care Default after reset (PUC/POR) The pin direction is controlled by the USCI module. UCB0CLK function takes precedence over UCA0STE function. If the pin is required as UCB0CLK input or output, USCI_A0 is forced to 3-wire SPI mode even if 4-wire SPI mode is selected. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 57 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Port P3 Pin Schematic: P3.6 to P3.7, Input/Output With Schmitt Trigger Pad Logic To ADC 10 INCHx = y ADC10AE0.y P3REN.x P3DIR.x 0 P3OUT.x 0 Module X OUT 1 0 DVCC 1 1 Direction 0: Input 1: Output 1 DVSS DVSS P3.6/A6 P3.7/A7 Bus Keeper P3SEL.x EN P3IN.x EN Module X IN D Table 28. Port P3 (P3.6, P3.7) Pin Functions PIN NAME (P3.x) P3.6/A6 P3.7/A7 (1) (2) (3) 58 x 6 7 y 6 7 FUNCTION P3.6 (2) (I/O) A6 (3) P3.7 (2) (I/O) A7 (3) CONTROL BITS/SIGNALS (1) P3DIR.x P3SEL.x ADC10AE0.y I: 0; O: 1 0 0 X X 1 I: 0; O: 1 0 0 X X 1 X = Don't care Default after reset (PUC/POR) Setting the ADC10AE0.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when applying analog signals. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Port P4 Pin Schematic: P4.0 to P4.2, Input/Output With Schmitt Trigger Timer_B Output Tristate Logic P4.6/TBOUTH/A15 P4SEL.6 P4DIR.6 ADC10AE1.7 Pad Logic P4REN.x P4DIR.x 0 0 Module X OUT 1 0 DVCC 1 1 Direction 0: Input 1: Output 1 P4OUT.x DVSS P4.0/TB0 P4.1/TB1 P4.2/TB2 Bus Keeper P4SEL.x EN P4IN.x EN Module X IN D Table 29. Port P4 (P4.0 to P4.2) Pin Functions PIN NAME (P4.x) x FUNCTION P4.0 (1) (I/O) P4.0/TB0 0 Timer_B3.CCI0A Timer_B3.TB0 P4.1 (1) (I/O) P4.1/TB1 1 Timer_B3.CCI1A Timer_B3.TB1 (1) 2 P4DIR.x P4SEL.x I: 0; O: 1 0 0 1 1 1 I: 0; O: 1 0 0 1 1 1 I: 0; O: 1 0 Timer_B3.CCI2A 0 1 Timer_B3.TB2 1 1 P4.2 (1) (I/O) P4.2/TB2 CONTROL BITS/SIGNALS Default after reset (PUC/POR) Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 59 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Port P4 Pin Schematic: P4.3 to P4.4, Input/Output With Schmitt Trigger Timer_B Output Tristate Logic P4.6/TBOUTH/A15 P4SEL.6 P4DIR.6 ADC10AE1.7 Pad Logic To ADC 10 † INCHx = 8+y ADC10AE1.y P4REN.x P4DIR.x 0 0 Module X OUT 1 0 1 1 Direction 0: Input 1: Output 1 P4OUT.x DVSS DVCC Bus Keeper P4SEL.x P4.3/TB0/A12 P4.4/TB1/A13 EN P4IN.x EN Module X IN 60 D Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Table 30. Port P4 (P4.3 to P4.4) Pin Functions PIN NAME (P4.x) x y FUNCTION P4.3 P4.3/TB0/A12 3 4 4 5 ADC10AE1.y 0 0 0 1 0 Timer_B3.TB0 1 1 0 A12 (3) X X 1 I: 0; O: 1 0 0 Timer_B3.CCI1B 0 1 0 Timer_B3.TB1 1 1 0 X X 1 A13 (1) (2) (3) P4SEL.x I: 0; O: 1 (2) (I/O) P4DIR.x Timer_B3.CCI0B P4.4 P4.4/TB1/A13 (2) CONTROL BITS/SIGNALS (1) (I/O) (3) X = Don't care Default after reset (PUC/POR) Setting the ADC10AE1.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when applying analog signals. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 61 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Port P4 Pin Schematic: P4.5, Input/Output With Schmitt Trigger Timer_B Output Tristate Logic P4.6/TBOUTH/A15 P4SEL.6 P4DIR.6 ADC10AE1.7 Pad Logic To ADC 10 INCHx = 14 ADC10AE1.6 P4REN.5 P4DIR.5 0 0 Module X OUT 1 0 DVCC 1 1 Direction 0: Input 1: Output 1 P4OUT.5 DVSS P4.5/TB3/A14 Bus Keeper P4SEL.5 EN P4IN.5 EN Module X IN D Table 31. Port P4 (P4.5) Pin Functions PIN NAME (P4.x) x y FUNCTION P4.5 (2) (I/O) P4.5/TB3/A14 5 6 Timer_B3.TB2 A14 (1) (2) (3) 62 (3) CONTROL BITS/SIGNALS (1) P4DIR.x P4SEL.x ADC10AE1.y I: 0; O: 1 0 0 1 1 0 X X 1 X = Don't care Default after reset (PUC/POR) Setting the ADC10AE1.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when applying analog signals. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 Port P4 Pin Schematic: P4.6, Input/Output With Schmitt Trigger Pad Logic To ADC 10 INCHx = 15 ADC10AE1.7 P4REN.6 P4DIR.6 0 0 Module X OUT 1 0 DVCC 1 1 Direction 0: Input 1: Output 1 P4OUT.6 DVSS P4.6/TBOUTH/A15 Bus Keeper P4SEL.6 EN P4IN.6 EN Module X IN D Table 32. Port P4 (P4.6) Pin Functions PIN NAME (P4.x) x y FUNCTION P4.6 (2) (I/O) P4.6/TBOUTH/A15 (1) (2) (3) 6 7 TBOUTH CONTROL BITS/SIGNALS (1) P4DIR.x P4SEL.x ADC10AE1.y I: 0; O: 1 0 0 0 1 0 DVSS 1 1 0 A15 (3) X X 1 X = Don't care Default after reset (PUC/POR) Setting the ADC10AE1.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when applying analog signals. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 63 NN325-Q1 SLAS824 – DECEMBER 2013 www.ti.com Port P4 Pin Schematic: P4.7, Input/Output With Schmitt Trigger Pad Logic DVSS P4REN.x P4DIR.x 0 P4OUT.x 0 1 0 DVCC 1 1 Direction 0: Input 1: Output 1 Module X OUT DVSS P4.7/TBCLK Bus Keeper P4SEL.x EN P4IN.x EN Module X IN D Table 33. Port P4 (Pr.7) Pin Functions PIN NAME (P4.x) x FUNCTION P4.7 P4.7/TBCLK (1) 64 7 (1) (I/O) CONTROL BITS/SIGNALS P4DIR.x P4SEL.x I: 0; O: 1 0 Timer_B3.TBCLK 0 1 DVSS 1 1 Default after reset (PUC/POR) Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 NN325-Q1 www.ti.com SLAS824 – DECEMBER 2013 JTAG Fuse Check Mode NN325-Q1 devices that have the fuse on the TEST terminal have a fuse check mode that tests the continuity of the fuse the first time the JTAG port is accessed after a power-on reset (POR). When activated, a fuse check current, ITF , of 1 mA at 3 V, 2.5 mA at 5 V can flow from the TEST pin to ground if the fuse is not burned. Care must be taken to avoid accidentally activating the fuse check mode and increasing overall system power consumption. When the TEST pin is again taken low after a test or programming session, the fuse check mode and sense currents are terminated. Activation of the fuse check mode occurs with the first negative edge on the TMS pin after power up or if TMS is being held low during power up. The second positive edge on the TMS pin deactivates the fuse check mode. After deactivation, the fuse check mode remains inactive until another POR occurs. After each POR the fuse check mode has the potential to be activated. The fuse check current flows only when the fuse check mode is active and the TMS pin is in a low state (see Figure 25). Therefore, the additional current flow can be prevented by holding the TMS pin high (default condition). Time TMS Goes Low After POR TMS ITF ITEST Figure 25. Fuse Check Mode Current NOTE The CODE and RAM data protection is ensured if the JTAG fuse is blown and the 256-bit bootloader access key is used. Also, see the Bootstrap Loader section for more information. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: NN325-Q1 65 PACKAGE OPTION ADDENDUM www.ti.com 10-Dec-2020 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) (4/5) (6) NN325TRHARQ1 ACTIVE VQFN RHA 40 2500 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 NN325 TQ1 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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