SN74AUCH16374
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SCES404E – JULY 2002 – REVISED JULY 2012
16-BIT EDGE-TRIGGERED D-TYPE FLIP-FLOP
WITH 3-STATE OUTPUTS
Check for Samples: SN74AUCH16374
FEATURES
1
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2
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•
•
•
•
•
•
•
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Member of the Texas Instruments Widebus™
Family
Optimized for 1.8-V Operation and Is 3.6-V I/O
Tolerant to Support Mixed-Mode Signal
Operation
Ioff Supports Partial-Power-Down Mode
Operation
Sub-1-V Operable
Max tpd of 2.8 ns at 1.8 V
Low Power Consumption, 20 μA Max ICC
±8-mA Output Drive at 1.8 V
Bus Hold on Data Inputs Eliminates the Need
for External Pullup/Pulldown Resistors
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
DESCRIPTION/ORDERING INFORMATION
This 16-bit edge-triggered D-type flip-flop is
operational at 0.8-V to 2.7-V VCC, but is designed
specifically for 1.65-V to 1.95-V VCC operation.
DGG OR DGV PACKAGE
(TOP VIEW)
1OE
1Q1
1Q2
GND
1Q3
1Q4
VCC
1Q5
1Q6
GND
1Q7
1Q8
2Q1
2Q2
GND
2Q3
2Q4
VCC
2Q5
2Q6
GND
2Q7
2Q8
2OE
1
48
2
47
3
46
4
45
5
44
6
43
7
42
8
41
9
40
10
39
11
38
12
37
13
36
14
35
15
34
16
33
17
32
18
31
19
30
20
29
21
28
22
27
23
26
24
25
1CLK
1D1
1D2
GND
1D3
1D4
VCC
1D5
1D6
GND
1D7
1D8
2D1
2D2
GND
2D3
2D4
VCC
2D5
2D6
GND
2D7
2D8
2CLK
The SN74AUCH16374 is particularly suitable for implementing buffer registers, I/O ports, bidirectional bus
drivers, and working registers. It can be used as two 8-bit flip-flops or one 16-bit flip-flop. On the positive
transition of the clock (CLK) input, the Q outputs of the flip-flop take on the logic levels set up at the data (D)
inputs.
A buffered output-enable (OE) input can be used to place the eight outputs in either a normal logic state (high or
low logic levels) or the high-impedance state. In the high-impedance state, the outputs neither load nor drive the
bus lines significantly. The high-impedance state and increased drive provide the capability to drive bus lines
without interface or pullup components.
OE does not affect internal operations of the latch. Old data can be retained or new data can be entered while
the outputs are in the high-impedance state.
1
2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2002–2012, Texas Instruments Incorporated
SN74AUCH16374
SCES404E – JULY 2002 – REVISED JULY 2012
www.ti.com
ORDERING INFORMATION
PACKAGE (1)
TA
–40°C to 85°C
(1)
ORDERABLE PART NUMBER
TOP-SIDE MARKING
TSSOP – DGG
Tape and reel
SN74AUCH16374DGGR
AUCH16374
TVSOP – DGV
Tape and reel
SN74AUCH16374DGVR
MJ374
VFBGA – GQL
Tape and reel
SN74AUCH16374GQLR
MJ374
VFBGA – ZQL
Tape and reel
SN74AUCH16374ZQLR
MJ374
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
DESCRIPTION/ORDERING INFORMATION(CONTINUED)
To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
Active bus-hold circuitry holds unused or undriven inputs at a valid logic state. Use of pullup or pulldown resistors
with the bus-hold circuitry is not recommended.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
2
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SCES404E – JULY 2002 – REVISED JULY 2012
GQL or ZQL PACKAGE
(TOP VIEW)
1
2
3
4
5
6
A
B
C
D
E
F
G
H
J
K
TERMINAL ASSIGNMENTS (1)
(1)
1
2
3
4
5
6
A
1OE
NC
NC
NC
NC
1CLK
B
1Q2
1Q1
GND
GND
1D1
1D2
C
1Q4
1Q3
VCC
VCC
1D3
1D4
D
1Q6
1Q5
GND
GND
1D5
1D6
E
1Q8
1Q7
1D7
1D8
F
2Q1
2Q2
2D2
2D1
G
2Q3
2Q4
GND
GND
2D4
2D3
H
2Q5
2Q6
VCC
VCC
2D6
2D5
J
2Q7
2Q8
GND
GND
2D8
2D7
K
2OE
NC
NC
NC
NC
2CLK
NC - No internal connection
FUNCTION TABLE
(EACH FLIP-FLOP)
INPUTS
OE
CLK
D
OUTPUT
Q
L
↑
H
H
L
↑
L
L
L
H or L
X
Q0
H
X
X
Z
Copyright © 2002–2012, Texas Instruments Incorporated
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SN74AUCH16374
SCES404E – JULY 2002 – REVISED JULY 2012
www.ti.com
LOGIC DIAGRAM (POSITIVE LOGIC)
1OE
1CLK
1D1
1
2OE
48
2CLK
C1
47
2
1D
1Q1
24
25
C1
2D1
36
13
1D
2Q1
To Seven Other Channels
To Seven Other Channels
Pin numbers shown are for the DGG and DGV packages.
Absolute Maximum Ratings (1)
over operating free-air temperature range (unless otherwise noted)
VCC
MIN
MAX
Supply voltage range
–0.5
3.6
UNIT
V
(2)
VI
Input voltage range
–0.5
3.6
V
VO
Voltage range applied to any output in the high-impedance or power-off state (2)
–0.5
3.6
V
VO
Output voltage range (2)
–0.5
VCC + 0.5
V
IIK
Input clamp current
VI < 0
–50
mA
IOK
Output clamp current
VO < 0
–50
mA
IO
Continuous output current
±20
mA
±100
mA
Continuous current through each VCC or GND
θJA
Tstg
(1)
(2)
(3)
4
Package thermal impedance (3)
DGG package
70
DGV package
58
ZQL/GQL package
42
Storage temperature range
–65
150
°C/W
°C
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
The package thermal impedance is calculated in accordance with JESD 51-7.
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SN74AUCH16374
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SCES404E – JULY 2002 – REVISED JULY 2012
Recommended Operating Conditions (1)
VCC
Supply voltage
VCC = 0.8 V
VIH
High-level input voltage
VCC = 1.1 V to 1.95 V
VCC = 2.3 V to 2.7 V
MIN
MAX
0.8
2.7
Low-level input voltage
VI
Input voltage
0.65 × VCC
0
VCC = 1.1 V to 1.95 V
Output voltage
IOH
High-level output current
IOL
Low-level output current
0.35 × VCC
Input transition rise or fall rate
TA
Operating free-air temperature
(1)
V
0.7
0
3.6
V
Active state
0
VCC
V
3-state
0
3.6
V
VCC = 0.8 V
–0.7
VCC = 1.1 V
–3
VCC = 1.4 V
–5
VCC = 1.65 V
–8
VCC = 2.3 V
–9
VCC = 0.8 V
0.7
VCC = 1.1 V
3
VCC = 1.4 V
5
VCC = 1.65 V
8
VCC = 2.3 V
Δt/Δv
V
1.7
VCC = 2.3 V to 2.7 V
VO
V
VCC
VCC = 0.8 V
VIL
UNIT
mA
mA
9
–40
20
ns/V
85
°C
All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
Copyright © 2002–2012, Texas Instruments Incorporated
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SN74AUCH16374
SCES404E – JULY 2002 – REVISED JULY 2012
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Electrical Characteristics
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER
VOH
VOL
II
All inputs
TEST CONDITIONS
IBHH
(2)
(3)
IBHLO
IBHHO
(4)
(5)
MIN TYP (1)
MAX
IOH = –100 µA
0.8 V to 2.7 V
IOH = –0.7 mA
0.8 V
IOH = –3 mA
1.1 V
0.8
IOH = –5 mA
1.4 V
1
IOH = –8 mA
1.65 V
1.2
IOH = –9 mA
2.3 V
1.8
IOL = 100 µA
0.8 V to 2.7 V
IOL = 0.7 mA
0.8 V
IOL = 3 mA
1.1 V
0.3
IOL = 5 mA
1.4 V
0.4
IOL = 8 mA
1.65 V
0.45
IOL = 9 mA
2.3 V
0.6
VI = VCC or GND
0.55
V
0.2
0.25
±5
1.1 V
10
VI = 0.47 V
1.4 V
15
VI = 0.57 V
1.65 V
20
VI = 0.7 V
2.3 V
40
VI = 0.8 V
1.1 V
–5
VI = 0.9 V
1.4 V
–15
VI = 1.07 V
1.65 V
–20
VI = 1.7 V
2.3 V
–40
VI = 0 to VCC
VI = 0 to VCC
UNIT
VCC – 0.1
0 to 2.7 V
VI = 0.35 V
IBHL
VCC
1.3 V
75
1.6 V
125
1.95 V
175
2.7 V
275
1.3 V
–75
1.6 V
–125
1.95 V
–175
2.7 V
–275
V
µA
µA
µA
µA
µA
Ioff
VI or VO = 2.7 V
IOZ
VO = VCC or GND
ICC
VI = VCC or GND,
Ci
VI = VCC or GND
2.5 V
3
pF
Co
VO = VCC or GND
2.5 V
5
pF
(1)
(2)
(3)
(4)
(5)
6
IO = 0
0
±10
µA
2.7 V
±10
µA
0.8 V to 2.7 V
20
µA
All typical values are at TA = 25°C.
The bus-hold circuit can sink at least the minimum low sustaining current at VIL max. IBHL should be measured after lowering VIN to GND
and then raising it to VIL max.
The bus-hold circuit can source at least the minimum high sustaining current at VIH min. IBHH should be measured after raising VIN to
VCC and then lowering it to VIH min.
An external driver must source at least IBHLO to switch this node from low to high.
An external driver must sink at least IBHHO to switch this node from high to low.
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SCES404E – JULY 2002 – REVISED JULY 2012
Timing Requirements
over recommended operating free-air temperature range (unless otherwise noted) (see Figure 1)
VCC = 0.8 V
TYP
VCC = 1.2 V
± 0.1 V
MIN
VCC = 1.5 V
± 0.1 V
MAX
MIN
VCC = 1.8 V
± 0.15 V
MAX
250
MIN
VCC = 2.5 V
± 0.2 V
MAX
250
MIN
UNIT
MAX
fclock
Clock frequency
85
tw
Pulse duration, CLK high or low
5.9
1.9
1.9
1.9
250
1.9
250
MHz
ns
tsu
Setup time, data before CLK↑
1.4
1.2
0.7
0.6
0.6
ns
th
Hold time, data after CLK↑
0.1
0.4
0.4
0.4
0.4
ns
Switching Characteristics
over recommended operating free-air temperature range (unless otherwise noted) (see Figure 1)
PARAMETER
FROM
(INPUT)
VCC = 0.8 V
TO
(OUTPUT)
fmax
VCC = 1.2 V
± 0.1 V
TYP
MIN
85
250
tpd
CLK
Q
7.3
ten
OE
Q
7
tdis
OE
Q
8.2
MAX
VCC = 1.5 V
± 0.1 V
MIN
MAX
250
VCC = 1.8 V
± 0.15 V
MIN
TYP
VCC = 2.5 V
± 0.2 V
MAX
250
MIN
UNIT
MAX
250
MHz
1
4.5
0.8
2.9
0.7
1.5
2.8
0.7
2.2
ns
1.2
5.3
0.8
3.6
0.8
1.5
2.9
0.7
2.2
ns
2
7.1
1
4.8
1.4
2.7
4.5
0.5
2.2
ns
Operating Characteristics (1)
TA = 25°C
TEST
CONDITIONS
PARAMETER
VCC = 0.8 V
VCC = 1.2 V
VCC = 1.5 V
VCC = 1.8 V
VCC = 2.5 V
TYP
TYP
TYP
TYP
TYP
UNIT
Power
dissipation
capacitance
1 fdata = 5 MHz,
Outputs
1 fclk = 10 MHz,
enabled,
1 fout = 5 MHz,
1 output
OE = GND,
switching
CL = 0 pF
24
24
24.1
26.2
31.2
pF
Cpd
(Z)
Power
dissipation
capacitance
Outputs
disabled,
1 clock
and 1
data
switching
1 fdata = 5 MHz,
1 fclk = 10 MHz,
fout = not
switching,
OE = VCC,
CL = 0 pF
7.5
7.5
8
9.4
13.2
pF
Cpd (3)
(each
clock)
Power
dissipation
capacitance
Outputs
disabled,
clock
only
switching
1 fdata = 0 MHz,
1 fclk = 10 MHz,
fout = not
switching,
OE = VCC,
CL = 0 pF
13.8
13.8
14
14.7
17.5
pF
Cpd (2)
(each
output)
(1)
(2)
(3)
Total device Cpd for multiple (n) outputs switching and (y) clocks inputs switching = {n * Cpd (each output)} + {y * Cpd (each clock)}.
Cpd (each output) is the Cpd for each data bit (input and output circuitry) as it operates at 5 MHz (Note: the clock is operating at 10 MHz
in this test, but its ICC component has been subtracted out).
Cpd (each clock) is the Cpd for the clock circuitry only as it operates at 10 MHz.
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SN74AUCH16374
SCES404E – JULY 2002 – REVISED JULY 2012
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PARAMETER MEASUREMENT INFORMATION
2 × VCC
S1
RL
From Output
Under Test
CL
(see Note A)
TEST
S1
tPLH/tPHL
tPLZ/tPZL
tPHZ/tPZH
Open
2 × VCC
GND
Open
GND
RL
LOAD CIRCUIT
VCC
CL
RL
V∆
0.8 V
1.2 V ± 0.1 V
1.5 V ± 0.1 V
1.8 V ± 0.15 V
2.5 V ± 0.2 V
15 pF
15 pF
15 pF
30 pF
30 pF
2 kΩ
2 kΩ
2 kΩ
1 kΩ
500 Ω
0.1 V
0.1 V
0.1 V
0.15 V
0.15 V
VCC
Timing Input
VCC/2
0V
tw
tsu
th
VCC
VCC/2
Input
VCC/2
VCC
VCC/2
Data Input
VCC/2
0V
0V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VOLTAGE WAVEFORMS
PULSE DURATION
VCC
VCC/2
Input
VCC/2
0V
VOH
VCC/2
Output
VCC/2
VOL
tPHL
VCC/2
tPLZ
VCC
VCC/2
tPZH
VCC/2
VOL
VCC/2
0V
Output
Waveform 1
S1 at 2 × VCC
(see Note B)
tPLH
VOH
Output
VCC/2
tPZL
tPHL
tPLH
VCC
Output
Control
Output
Waveform 2
S1 at GND
(see Note B)
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
VOL + V∆
VOL
tPHZ
VCC/2
VOH − V∆
VOH
≈0 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, slew rate ≥ 1 V/ns.
D. The outputs are measured one at a time, with one transition per measurement.
E. tPLZ and tPHZ are the same as tdis.
F. tPZL and tPZH are the same as ten.
G. tPLH and tPHL are the same as tpd.
H. All parameters and waveforms are not applicable to all devices.
Figure 1. Load Circuit and Voltage Waveforms
8
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SCES404E – JULY 2002 – REVISED JULY 2012
Changes from Revision D (May 2005) to Revision E
•
Page
Added new ZQL package to the datasheet. ......................................................................................................................... 2
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PACKAGE OPTION ADDENDUM
www.ti.com
20-Jan-2021
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
SN74AUCH16374DGGR
ACTIVE
TSSOP
DGG
48
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
AUCH16374
SN74AUCH16374DGVR
ACTIVE
TVSOP
DGV
48
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
MJ374
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of