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CY7C1020BN-12VC

CY7C1020BN-12VC

  • 厂商:

    EUPEC(英飞凌)

  • 封装:

    SOJ44_400MIL

  • 描述:

    STANDARD SRAM, 32KX16

  • 数据手册
  • 价格&库存
CY7C1020BN-12VC 数据手册
CY7C1020BN 32K x 16 Static RAM Features Functional Description • High speed The CY7C1020BN is a high-performance CMOS static RAM organized as 32,768 words by 16 bits. This device has an automatic power-down feature that significantly reduces power consumption when deselected. — tAA = 12, 15 ns • CMOS for optimum speed/power • Low active power — 825 mW (max.) • Low CMOS standby power (L version only) — 2.75 mW (max.) • Automatic power-down when deselected • Independent control of upper and lower bits • Available in 44-pin TSOP II and 400-mil SOJ Writing to the device is accomplished by taking Chip Enable (CE) and Write Enable (WE) inputs LOW. If Byte Low Enable (BLE) is LOW, then data from I/O pins (I/O1 through I/O8), is written into the location specified on the address pins (A0 through A15). If Byte High Enable (BHE) is LOW, then data from I/O pins (I/O9 through I/O16) is written into the location specified on the address pins (A0 through A15). Reading from the device is accomplished by taking Chip Enable (CE) and Output Enable (OE) LOW while forcing the Write Enable (WE) HIGH. If Byte Low Enable (BLE) is LOW, then data from the memory location specified by the address pins will appear on I/O1 to I/O8. If Byte High Enable (BHE) is LOW, then data from memory will appear on I/O9 to I/O16. See the truth table at the back of this data sheet for a complete description of read and write modes. The input/output pins (I/O1 through I/O16) are placed in a high-impedance state when the device is deselected (CE HIGH), the outputs are disabled (OE HIGH), the BHE and BLE are disabled (BHE, BLE HIGH), or during a write operation (CE LOW, and WE LOW). The CY7C1020BN is available in standard 44-pin TSOP Type II and 400-mil-wide SOJ packages. Logic Block Diagram Pin Configuration SOJ / TSOP II Top View SENSE AMPS A7 A6 A5 A4 A3 A2 A1 A0 ROW DECODER DATA IN DRIVERS 32K x 16 RAM Array I/O1–I/O8 I/O9–I/O16 COLUMN DECODER A8 A9 A10 A11 A12 A13 A14 BHE WE CE OE BLE Cypress Semiconductor Corporation Document #: 001-06443 Rev. ** • 198 Champion Court • NC A3 A2 A1 A0 CE I/O1 I/O2 I/O3 I/O4 VCC VSS I/O5 I/O6 I/O7 I/O8 WE A15 A14 A13 A12 NC 1 44 2 3 43 42 4 41 40 39 38 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 A5 A6 A7 OE BHE BLE I/O16 I/O15 I/O14 I/O13 VSS VCC I/O12 I/O11 I/O10 I/O9 NC A8 A9 A10 A11 NC San Jose, CA 95134-1709 • 408-943-2600 Revised February 1, 2006 CY7C1020BN Selection Guide 7C1020BN-12 7C1020BN-15 Maximum Access Time (ns) 12 15 Maximum Operating Current (mA) 140 130 Maximum CMOS Standby Current (mA) L Maximum Ratings 3 3 0.5 0.5 Current into Outputs (LOW)......................................... 20 mA (Above which the useful life may be impaired. For user guidelines, not tested.) Storage Temperature ................................. –65°C to +150°C Ambient Temperature with Power Applied............................................. –55°C to +125°C Static Discharge Voltage............................................ >2001V (per MIL-STD-883, Method 3015) Latch-Up Current ..................................................... >200 mA Operating Range Supply Voltage on VCC to Relative GND[1] .... –0.5V to +7.0V DC Voltage Applied to Outputs in High Z State[1] ......................................–0.5V to VCC+0.5V DC Input Voltage[1] ...................................–0.5V to VCC+0.5V Range Commercial Industrial Ambient Temperature[2] VCC 0×C to +70×C 5V ± 10% –40×C to +85×C 5V ± 10% Electrical Characteristics Over the Operating Range Parameter 7C1020BN-12 Test Conditions Description Min. Max. VOH Output HIGH Voltage VCC = Min., IOH = –4.0 mA VOL Output LOW Voltage VCC = Min., IOL = 8.0 mA VIH Input HIGH Voltage 2.2 6.0 VIL Input LOW Voltage[1] –0.5 0.8 IIX Input Load Current GND < VI < VCC –1 +1 IOZ Output Leakage Current GND < VI < VCC, Output Disabled –1 +1 Current[3] 2.4 7C1020BN-15 Min. 2.4 0.4 VCC = Max., VOUT = GND Max. Unit V 0.4 V 2.2 6.0 V –0.5 0.8 V –1 +1 µA –1 +1 µA IOS Output Short Circuit –300 –300 mA ICC VCC Operating Supply Current VCC = Max., IOUT = 0 mA, f = fMAX = 1/tRC 140 130 mA ISB1 Automatic CE Power-Down Current—TTL Inputs Max. VCC, CE > VIH VIN > VIH or VIN < VIL, f = fMAX 20 20 mA ISB2 Automatic CE Power-Down Current—CMOS Inputs Max. VCC, CE > VCC – 0.3V, VIN > VCC – 0.3V, or VIN < 0.3V, f=0 3 3 mA 0.5 0.5 mA L Capacitance[4] Parameter Description CIN Input Capacitance COUT Output Capacitance Test Conditions TA = 25°C, f = 1 MHz, VCC = 5.0V Max. Unit 8 pF 8 pF Notes: 1. VIL (min.) = –2.0V for pulse durations of less than 20 ns. 2. TA is the case temperature. 3. Not more than one output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds. 4. Tested initially and after any design or process changes that may affect these parameters. Document #: 001-06443 Rev. ** Page 2 of 8 CY7C1020BN AC Test Loads and Waveforms R 481Ω R 481Ω 5V 5V OUTPUT ALL INPUT PULSES 3.0V 90% OUTPUT 30 pF R2 255Ω R2 255Ω 5 pF INCLUDING JIG AND SCOPE (a) INCLUDING JIG AND SCOPE (b) 167 90% 10% 10% GND Rise Time: 1 V/ns Fall Time: 1 V/ns 1.73V OUTPUT Equivalent to: THÉVENIN EQUIVALENT 30 pF Switching Characteristics[5] Over the Operating Range 7C1020BN-12 Parameter Description Min. Max. 7C1020BN-15 Min. Max. Unit Read Cycle tRC Read Cycle Time 12 tAA Address to Data Valid tOHA Data Hold from Address Change tACE CE LOW to Data Valid 12 15 ns tDOE OE LOW to Data Valid 6 7 ns Z[6] tLZOE OE LOW to Low tHZOE OE HIGH to High Z[6, 7] tLZCE CE LOW to Low Z[6] CE HIGH to High tPU CE LOW to Power-Up tPD CE HIGH to Power-Down tDBE Byte Enable to Data Valid tLZBE Byte Enable to Low Z tHZBE Write 12 3 15 3 ns 7 3 6 0 7 6 0 ns ns 15 ns 7 ns 0 6 ns ns 0 12 ns ns 0 6 Byte Disable to High Z ns 3 0 Z[6, 7] tHZCE 15 ns 7 ns Cycle[8] tWC Write Cycle Time 12 15 ns tSCE CE LOW to Write End 9 10 ns tAW Address Set-Up to Write End 8 10 ns tHA Address Hold from Write End 0 0 ns tSA Address Set-Up to Write Start 0 0 ns tPWE WE Pulse Width 8 10 ns tSD Data Set-Up to Write End 6 8 ns tHD Data Hold from Write End 0 0 ns 3 3 ns tLZWE [6] WE HIGH to Low Z [6, 7] tHZWE WE LOW to High Z tBW Byte Enable to End of Write 6 8 7 9 ns ns Notes: 5. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified IOL/IOH and 30-pF load capacitance. 6. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device. 7. tHZOE, tHZBE, tHZCE, and tHZWE are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads. Transition is measured ±500 mV from steady-state voltage. 8. The internal write time of the memory is defined by the overlap of CE LOW, WE LOW and BHE / BLE LOW. CE, WE and BHE / BLE must be LOW to initiate a write, and the transition of these signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write. Document #: 001-06443 Rev. ** Page 3 of 8 CY7C1020BN Switching Waveforms Read Cycle No. 1[9, 10] tRC ADDRESS tAA tOHA DATA OUT PREVIOUS DATA VALID DATA VALID Read Cycle No. 2 (OE Controlled)[10, 11] ADDRESS tRC CE tACE OE tHZOE tDOE BHE, BLE tLZOE tHZCE tDBE tLZBE DATA OUT HIGH IMPEDANCE tLZCE VCC SUPPLY CURRENT tHZBE HIGH IMPEDANCE DATA VALID tPD tPU 50% IICC CC 50% IISB SB Notes: 9. Device is continuously selected. OE, CE, BHE and/or BHE = VIL. 10. WE is HIGH for read cycle. 11. Address valid prior to or coincident with CE transition LOW. Document #: 001-06443 Rev. ** Page 4 of 8 CY7C1020BN Switching Waveforms (continued) Write Cycle No. 1 (CE Controlled)[12, 13] tWC ADDRESS CE tSA tSCE tAW tHA tPWE WE tBW BHE, BLE tSD tHD DATA I/O Write Cycle No. 2 (BLE or BHE Controlled) tWC ADDRESS BHE, BLE tSA tBW tAW tHA tPWE WE tSCE CE tSD tHD DATA I/O Notes: 12. Data I/O is high impedance if OE or BHE and/or BLE= VIH. 13. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state. Document #: 001-06443 Rev. ** Page 5 of 8 CY7C1020BN Switching Waveforms (continued) Write Cycle No. 3 (WE Controlled, OE LOW) tWC ADDRESS tSCE CE tAW tHA tSA tPWE WE tBW BHE, BLE tHZWE tSD tHD DATA I/O tLZWE Truth Table CE OE WE H X L L L X BLE BHE X X X High Z High Z Power-Down Standby (ISB) H L L Data Out Data Out Read – All bits Active (ICC) L H Data Out High Z Read – Lower bits only Active (ICC) H L High Z Data Out Read – Upper bits only Active (ICC) L L Data In Data In Write – All bits Active (ICC) L H Data In High Z Write – Lower bits only Active (ICC) H L High Z Data In Write – Upper bits only Active (ICC) L I/O1–I/O8 I/O9–I/O16 Mode Power L H H X X High Z High Z Selected, Outputs Disabled Active (ICC) L X X H H High Z High Z Selected, Outputs Disabled Active (ICC) Ordering Information Speed (ns) 12 15 Ordering Code Package Diagram Package Type Operating Range CY7C1020BN-12VC 51-85082 44-Lead (400-Mil) Molded SOJ Commercial CY7C1020BN-12VXC 51-85082 44-Lead (400-Mil) Molded SOJ (Pb-free) Commercial CY7C1020BN-12ZC 51-85087 44-pin TSOP Type II Commercial CY7C1020BN-12ZXC 51-85087 44-pin TSOP Type II (Pb-free) Commercial CY7C1020BN-15ZC 51-85087 44-pin TSOP Type II Commercial CY7C1020BN-15ZXC 51-85087 44-pin TSOP Type II (Pb-free) Commercial Please contact local sales representative regarding availability of these parts. Document #: 001-06443 Rev. ** Page 6 of 8 CY7C1020BN Package Diagrams 44-Lead (400-Mil) Molded SOJ (51-85082) 51-85082-*B 44-Pin TSOP II (51-85087) 51-85087-*A All product and company names mentioned in this document may be the trademarks of their respective holders. Document #: 001-06443 Rev. ** Page 7 of 8 © Cypress Semiconductor Corporation, 2006. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. CY7C1020BN Document History Page Document Title: CY7C1020BN 32K x 16 Static RAM Document #: 001-06443 REV. ** ECN NO. 426812 Issue Date See ECN Document #: 001-06443 Rev. ** Orig. of Change NXR Description of Change New Data Sheet Page 8 of 8
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