HS9-1840RH-Q

Semiconductor E RN D FO ARH DE MEN -1840 COM See HS RE NOT September 1997 ES WD IGN S HS-1840RH Rad-Hard 16 Channel CMOS Analog Multiplexer with High-Z Analog Input Protection Description The HS-1840RH is a radiation hardened, monolithic 16 channel multiplexer constructed with the Harris Linear Dielectric Isolation CMOS process. It is designed to provide a high input impedance to the analog source if device power fails (open) or the analog signal voltage inadvertently exceeds the supply rails during powered operation. Excellent for use in redundant applications, since the secondary device can be operated in a standby unpowered mode affording no additional power drain. More significantly, a very high impedance exists between the active and inactive devices preventing any interaction. One of sixteen channel selection is controlled by a 4-bit binary address plus an Enable-Inhibit input which conveniently controls the ON/OFF operation of several multiplexers in a system. All digital inputs have electrostatic discharge protection. PKG. NO. Features • Radiation Environment - Gamma Rate (γ) 1 x 108 RAD(Si)/s tle (HS-1840RH) - Gamma Dose (γ) 2 x 105 RAD(Si) ject (Rad-Hard 16 Power Consumption Channel CMOS Analog • Low tiplexer with• High-Z Analog Input Protection) Fast Access Time 1000ns hor () • High Analog Input Impedance 500MΩ During Power Loss (Open) words () • Dielectrically Isolated Device Islands ator () • Excellent In Hi-Rel Redundant Systems CINFO pdfmark • Break-Before-Make Switching • No Latch-Up geMode /UseOutlines Ordering Information CVIEW pdfmark PART NUMBER HS1-1840RH-Q HS1-1840RH-8 HS1-1840RH/Proto HS1-1840RH/Sample HS9-1840RH-Q HS9-1840RH-8 HS9-1840RH/Proto HS9-1840RH/Sample TEMP. RANGE (oC) -55 to 125 -55 to 125 -55 to 125 25 -55 to 125 -55 to 125 -55 to 125 25 PACKAGE 28 Ld CERDIP 28 Ld CERDIP 28 Ld CERDIP 28 Ld CERDIP 28 Ld FP 28 Ld FP 28 Ld FP 28 Ld FP The HS-1840RH has been specifically designed to meet exposure to radiation environments. It is available in a 28 lead Ceramic Sidebraze dual-in-line package and 28 lead Ceramic Flatpack. It is guaranteed operational from -55oC to +125oC. Pinouts HS1-1840RH 28 LEAD SIDEBRAZE CERDIP CASE OUTLINE GDIP1-T28, COMPLIANT TO MIL-STD1835 PACKAGE TOP VIEW +VS 1 NC 2 NC 3 IN 16 4 IN 15 5 IN 14 6 IN 13 7 IN 12 8 IN 11 9 IN 10 10 IN 9 11 GND 12 (+5VS) VREF 13 ADDR A3 14 28 OUT 27 -VS 26 IN 8 25 IN 7 24 IN 6 23 IN 5 22 IN 4 21 IN 3 20 IN 2 19 IN 1 18 ENABLE 17 ADDR A0 16 ADDR A1 15 ADDR A2 HS9-1840RH 28 LEAD CERAMIC SIDEBRAZE CASE FLATPACK OUTLINE CDFP3-F28, COMPLIANT TO MIL-STD-1835 PACKAGE TOP VIEW +VS NC NC IN 16 IN 15 IN 14 IN 13 IN 12 IN 11 IN 10 IN 9 GND (+5VS) VREF ADDR A3 1 2 3 4 5 6 7 8 9 10 11 12 13 14 28 27 26 25 24 23 22 21 20 19 18 17 16 15 OUT -VS IN 8 IN 7 IN 6 IN 5 IN 4 IN 3 IN 2 IN 1 ENABLE ADDR A0 ADDR A1 ADDR A2 CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures. Copyright © Harris Corporation 1997 File Number Spec Number 1 3992.1 518022 HS-1840RH Functional Diagram A0 1 P IN 1 A1 DIGITAL ADDRESS A2 OUT A3 1 EN P IN 16 ADDRESS INPUT BUFFER AND LEVEL SHIFTER DECODERS MULTIPLEX SWITCHES Truth Table A3 X L L L L L L L L H H H H H H H H A2 X L L L L H H H H L L L L H H H H A1 X L L H H L L H H L L H H L L H H A0 X L H L H L H L H L H L H L H L H EN H L L L L L L L L L L L L L L L L “ON” CHANNEL None 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Spec Number 2 518022 Specifications HS-1840RH Absolute Maximum Ratings Supply Voltage Between Pins 1 and 27 . . . . . . . . . . . . . . . . . . +40V +VSUPPLY to Ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +20V -VSUPPLY to Ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-20V VREF to Ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +20V Analog Input Overvoltage +VS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +25V (Power On/Off) -VS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -25V (Power On/Off) Digital Input Overvoltage +VEN, +VA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VREF +4V -VEN, -VA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . GND -4V Continuous Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10mA Storage Temperature Range . . . . . . . . . . . . . . . . . -65oC to +150oC Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC Lead Temperature (Soldering 10s) . . . . . . . . . . . . . . . . . . . . +275oC Reliability Information Thermal Resistance . . . . . . . . . . . . . . . . . . θJA θJC Sidebraze Package . . . . . . . . . . . . . . . . . 83.1oC/W 19.1oC/W Flatpack Package . . . . . . . . . . . . . . . . . . 49.1oC/W 16.5oC/W Total Power Dissipation (Note) Sidebraze CerDIP Package . . . . . . . . . . . . . . . . . . . . . . . 1600mW Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . . 1400mW ESD Classification. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1 NOTE: For DIP Derate 20.4mW/oC above TA = +95oC For Flatpack Derate 18.5mW/oC above TA = +95oC CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Operating Conditions Operating Supply Voltage (±VSUPPLY) . . . . . . . . . . . . . . . . . . . . ±15V Operating Temperature Range . . . . . . . . . . . . . . . . -55oC to +125oC VREF (Pin 13) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +5V Logic Low Level (VAL). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +0.8V Logic High Level (VAH) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +4.0V TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS Device Guaranteed and 100% Tested. Unless Otherwise Specified: V- = -15V, V+ = +15V, VREF = +5V, VAH = +4.0V, VAL = 0.8V GROUP A SUBGROUPS 7, 8A, 8B Measure Inputs Sequentially Ground All Unused Pins VS = +10V, All Unused Inputs and Output = -10V, VEN = 4V VS = -10V, All Unused Inputs, Output = +10V, VEN = 4V V+, V-, VREF, A0, A1, A2, A3,A4, EN = GND, Unused Inputs Tied to GND, VS = +25V VS = +25V, VD = 0V, VEN = 4V All Unused Inputs Tied to GND VS = -25V, VD = 0V, VEN = 4V All Unused Inputs Tied to GND VD = +10V, VEN = 4V All Unused Inputs = -10V VD = -10V, VEN = 4V All Unused Inputs = +10V VS = +25V, Measure VD, VEN = 4V, All Unused Inputs to GND VS = -25V, Measure VD, All Unused Inputs to GND 1, 2, 3 LIMITS TEMPERATURE -55oC, +25oC, +125oC Input Leakage Current, Address, or Enable Pins Leakage Current Into the Source Terminal of an “Off” Switch IAH IAL +IS(OFF) -55oC, +25oC, +125oC +25oC +125oC,-55oC +25oC +125oC, -55oC -1000 1000 nA MIN -5 MAX +15 UNITS V PARAMETER Analog Signal Range SYMBOL VS CONDITIONS 1 2, 3 1 2, 3 1 2, 3 -10 -100 -10 -100 -50 -100 10 100 10 100 50 100 nA nA nA nA nA nA -IS(OFF) Leakage Current into the Source Terminal of an “Off” Switch With Power “Off” Leakage Current Into the Source Terminal of an “Off” Switch With Overvoltage Applied Leakage Current Into the Drain Terminal of an “Off” Switch +IS(OFF) Power Off +25oC +125oC, -55oC +IS(OFF) Overvoltage -IS(OFF) Overvoltage +ID(OFF) 1, 2, 3 1, 2, 3 1 2, 3 1 2, 3 1, 2, 3 -55oC, +25oC, +125oC -55oC, +25oC, +125oC +25oC +125oC, -55oC -1000 -1000 -10 -100 -10 -100 -1000 1000 1000 10 100 10 100 1000 nA nA nA nA nA nA nA -ID(OFF) +25oC +125oC, -55oC, -55oC Leakage Current Into the Drain Terminal of an “Off” Switch With Overvoltage Applied +ID(OFF) Overvoltage -ID(OFF) Overvoltage +25oC, +125oC 1, 2, 3 -55oC, +25oC, +125oC -1000 1000 nA Spec Number 3 518022 Specifications HS-1840RH TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued) Device Guaranteed and 100% Tested. Unless Otherwise Specified: V- = -15V, V+ = +15V, VREF = +5V, VAH = +4.0V, VAL = 0.8V GROUP A SUBGROUPS 1 2, 3 1 2, 3 1, 2, 3 1, 2, 3 1, 2, 3 1, 2, 3 1, 2, 3 1, 2, 3 1, 2, 3 LIMITS TEMPERATURE +25oC +125oC, -55oC MIN -10 -100 -10 -100 50 50 50 -0.5 -0.5 MAX 10 100 10 100 1000 4000 2500 0.5 0.5 UNITS nA nA nA nA Ω Ω Ω mA mA mA mA PARAMETER Leakage Current from an “On” Driver into the Switch (Drain & Source) SYMBOL +ID(ON) CONDITIONS VS = +10V, VD = +10V, VEN = 0.8V All Unused Inputs = -10V VS = -10V, VD = -10V, VEN = 0.8V, All Unused Inputs = +10V VS = +15V, ID = -1mA, VEN = 0.8V VS = -5V, ID = +1mA, VEN = 0.8V VS = +5V, ID = -1mA, VEN = 0.8V VEN = 0.8V VEN = 0.8V VEN = 4.0V VEN = 4.0V -ID(ON) +25oC +125oC, -55oC, -55oC Switch On Resistance +15V R(ON) -5V R(ON) +5V R(ON) +25oC, +125oC -55oC, +25oC, +125oC -55oC, +25oC, +125oC -55oC, +25oC, +125oC -55oC, +25oC, +125oC -55oC, +25oC, +125oC -55oC, +25oC, +125oC Positive Supply Current Negative Supply Current Positive Standby Supply Current Negative Standby Supply Current I(+) I(-) +ISBY -ISBY TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS Device Guaranteed and 100% Tested. Unless Otherwise Specified: V- = -15V, V+ = +15V, VREF = +5V, VAH = +4.0V, VAL = 0.8V GROUP A SUBGROUPS 9 10, 11 TON(A), TOFF(A) TON(EN), TOFF(EN) RL = 10kΩ, CL = 50pF 9 10, 11 RL = 1000Ω, CL = 50pF 9 10, 11 LIMITS TEMPERATURE +25oC +125oC, -55oC MIN 25 5 MAX 600 1000 600 1000 UNITS ns ns ns ns ns ns PARAMETER Break-Before-Make Time Delay Propagation Delay Times: Address Inputs to I/O Channels Enable to I/O SYMBOL TD CONDITIONS RL = 1000Ω, CL = 50pF +25oC +125oC, -55oC +25oC +125oC, -55oC TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS Device Characterized At: V- = -15V, V+ = +15V, VREF = +5V, VAH = +4.0V, VAL = 0.8V, Unless Otherwise Specified LIMITS PARAMETER Capacitance Address Input Capacitance Channel Input Capacitance Channel Output Off Isolation SYMBOL CA CS(OFF) CD(OFF) TOFF(EN) VISO CONDITIONS +VS = -VS = 0V, f = 1MHz +VS = -VS = 0V, f = 1MHz +VS = -VS = 0V, f = 1MHz VEN = 4.0V, f = 200kHz, CL = 7pF, RL = 1kΩ, VS = 3.0VRMS NOTE 1 1 1 1 TEMPERATURE +25oC +25oC +25oC +25oC MIN 45 MAX 7 5 50 UNITS pF pF pF dB NOTE: 1. The parameters listed in Table 3 are controlled via design or process parameters and not directly tested. These parameters are characterized upon initial design and after major process and/or design changes. Spec Number 4 518022 Specifications HS-1840RH TABLE 4. POST 200K RAD(Si) ELECTRICAL CHARACTERISTICS Tested, per MIL-STD-883. Unless Otherwise Specified: V- = -15V, V+ = +15V, VREF = +5V, VAH = +4.5V, VAL = 0.5V GROUP A SUBGROUPS 1 1 1 1 LIMITS TEMPERATURE +25oC +25oC +25oC +25oC MIN -1000 -100 -100 -100 MAX 1000 100 100 100 UNITS nA nA nA nA PARAMETER Input Leakage Current, Address, or Enable Pins Leakage Current Into the Source Terminal of an “Off” Switch SYMBOL IAH IAL +IS(OFF) -IS(OFF) +IS(OFF) Power Off CONDITIONS Measure Inputs Sequentially, Ground All Unused Pins VS = +10V, All Unused Inputs and Output = -10V, VEN = 4.5V VS = -10V, All Unused Inputs and Output = +10V, VEN = 4.5V V+, V-, VREF, A0, A1, A2, A3, A4, EN = GND, Unused Inputs Tied to GND, VS = +25V VS = +25V, VD = 0V, VEN = 4.5V All Unused Inputs Tied to GND VS = -25V, VD = 0V, VEN = 4.5V All Unused Inputs Tied to GND VD = +10V, VEN = 4.5V All Unused Inputs = -10V VD = -10V, VEN = 4.5V All Unused Inputs = +10V VS = +25V, Measure VD, VEN = 4.5V All Unused Inputs to GND VS = -25V, Measure VD, VEN = 4.5V All Unused Inputs to GND VS = +10V, VD = +10V, VEN = 0.5V All Unused Inputs = -10V VS = -10V, VD = -10V, VEN = 0.5V All Unused Inputs = +10V VS = +15V, ID = -1mA, VEN = 0.5V VS = -5V, ID = +1mA, VEN = 0.5V VS = +5V, ID = -1mA, VEN = 0.5V VEN = 0.5V VEN = 0.5V VEN = 4.5V VEN = 4.5V RL = 1000Ω, CL = 50pf RL = 10KΩ, CL = 50pf Leakage Current into the Source Terminal of an “Off” Switch With Power “Off” Leakage Current Into the Source Terminal of an “Off” Switch With Overvoltage Applied Leakage Current Into the Drain Terminal of an “Off” Switch +IS(OFF) Overvoltage -IS(OFF) Overvoltage +ID(OFF) -ID(OFF) +ID(OFF) Overvoltage -ID(OFF) Overvoltage +ID(ON) 1 1 1 1 1 +25oC +25oC +25oC +25oC +25oC -1500 -1500 -100 -100 -1000 1500 1500 100 100 1000 nA nA nA nA nA Leakage Current Into the Drain Terminal of an “Off” Switch With Overvoltage Applied 1 +25oC -1000 1000 nA Leakage Current from an “On” Driver into the Switch (Drain & Source) 1 +25oC -100 100 nA -ID(ON) 1 +25oC -100 100 nA Switch On Resistance +15V R(ON) -5V R(ON) +5V R(ON) 1 1 1 1 1 1 1 9 9 +25oC +25oC +25oC +25oC +25oC +25oC +25oC +25oC +25oC 50 50 50 -0.50 -0.50 5 - 1000 4000 2500 0.50 0.50 3000 Ω Ω Ω mA mA mA mA ns ns Positive Supply Current Negative Supply Current Positive Standby Supply Current Negative Standby Supply Current Make-Before-Break Time Delay Propagation Delay Times: Address Inputs to I/O Channels Enable to I/O I(+) I(-) +I(SBY) -I(SBY) TD TON (A) TOFF (A) TON (EN) TOFF (EN) RL = 1000Ω, CL = 50pf 9 +25oC - 3000 ns Spec Number 5 518022 Specifications HS-1840RH TABLE 5. DC POST BURN-IN DELTA ELECTRICAL CHARACTERISTICS Guaranteed, per MIL-STD-883, Method 1019. Unless Otherwise Specified: V- = -15V, V+ = +15V, VREF = +5V, VAH = +4.0V, VAL = 0.8V GROUP A SUBGROUPS 1 LIMITS TEMPERATURE +25oC MIN -100 MAX 100 UNITS nA PARAMETER Input Leakage Current, Address, or Enable Pins Leakage Current Into the Source Terminal of an “Off” Switch SYMBOL IAH IAL +IS(OFF) -IS(OFF) +ID(OFF) -ID(OFF) + ID(ON) CONDITIONS Measure Inputs Sequentially, Ground All Unused Pins VS = +10V, All Unused Inputs & Output = -10V, VEN = 4.0V VS = -10V, All Unused Inputs & Output = +10V, VEN = 4.0V VD = +10V, VEN = 4.0V All Unused Inputs = -10V VD = -10V, VEN = 4.0V All Unused Inputs = +10V VS = +10V, VD = +10V, VEN = 0.8V All Unused Inputs = -10V VS = -10V, VD = -10V, VEN = 0.8V All Unused Inputs = +10V VS = +15V, ID = -1mA, VEN = 0.8V VS = -5V, ID = +1mA, VEN = 0.8V VEN = 0.8V VEN = 0.8V VEN = 4.0V VEN = 4.0V 1 1 1 1 1 +25oC +25oC +25oC +25oC +25oC -20 -20 -20 -20 -20 20 20 20 20 20 nA nA nA nA nA Leakage Current Into the Drain Terminal of an “Off” Switch Leakage Current from an “On” Driver into the Switch (Drain & Source) -ID(ON) 1 +25oC -20 20 nA Switch On Resistance +15V R(ON) -5V R(ON) 1 1 1 1 1 1 +25oC +25oC +25oC +25oC +25oC +25oC -150 -250 -50 -50 -50 -50 150 250 50 50 50 50 Ω Ω µA µA µA µA Positive Supply Current Negative Supply Current Positive Standby Supply Current Negative Standby Supply Current I(+) I(-) +ISBY -ISBY TABLE 6. APPLICABLE SUBGROUPS CONFORMANCE GROUPS Initial Test Interim Test PDA Final Test Group A Group B B5 Others Group C Group D Group E, Subgroup 2 METHOD 100%/5004 100%/5004 100%/5004 100%/5004 Samples/5005 Samples/5005 Samples/5005 Samples/5005 Samples/5005 Samples/5005 -Q SUBGROUPS 1 1 1 1, 2, 3, 7, 8A, 8B, 9, 10, 11 1, 2, 3, 7, 8A, 8B, 9, 10, 11 1, 2, 3 1, 7 N/A 1, 7 1, 7 -8 SUBGROUPS 1 N/A 1 1, 2, 3, 7, 8A, 8B, 9, 10, 11 1, 2, 3, 7, 8A, 8B, 9, 10, 11 N/A N/A 1, 2, 3 1, 7 1, 7 Spec Number 6 518022 HS-1840RH Performance Characteristics and Test Circuits ACCESS TIME vs LOGIC LEVEL (HIGH) 4.0V 50% VA 0.8V VA 50Ω A3 A2 A1 A0 0.8V EN GND IN 1 IN 2 IN 15 IN 16 15V, 0V 0V, 15V VOUT VOUT 50% 0V tA 10K 50pF BREAK-BEFORE-MAKE DELAY (tOPEN) 4.0V VA 50Ω A3 A2 A1 A0 EN VA VOUT 50% 50% 0.8V IN 1 IN 2 IN 15 IN 16 GND OUT 1K +5V 0.8V VOUT 50pF tOPEN ENABLE DELAY (tON(EN), tOFF(EN)) VA 4.0V A3 0.8V A2 A1 A0 90% OUTPUT VA 50Ω EN 1K VOUT 50pF IN 2 IN 16 IN 1 +10V VOUT tON(EN) 10% tOFF(EN) Spec Number 7 518022 HS-1840RH Burn-In/Life Test Circuits R +VS R 1 2 3 4 5 6 7 8 9 10 11 12 13 14 28 27 26 25 24 23 22 21 20 19 18 17 16 15 R -VS +VS R 1 2 3 4 5 6 7 8 9 10 11 12 13 14 28 27 26 25 24 23 22 21 20 19 18 17 16 15 R -VS R F5 F1 F2 F3 GND F4 GND VR R DYNAMIC BURN-IN AND LIFE TEST CIRCUIT NOTES: VS+ = +15.5V ±0.5V, VS- = -15.5V ±0.5V R = 1kΩ ±5% C1 = C2 = 0.01µF ±10%, 1 each per socket, minimum D1 = D2 = 1N4002, 1 each per board, minimum Input Signals: square wave, 50% duty cycle, 0V to 15V peak ±10% F1 = 100kHz; F2 = F1/2; F3 = F1/4; F4 = F1/8; F5 = F1/16 NOTES: 1. The above test circuits are utilized for all package types. 2. The Dynamic Test Circuit is utilized for all life testing. NOTES: STATIC BURN-IN TEST CIRCUIT R = 1kΩ ±5%, 1/4W C1 = C2 = 0.01µF minimum, 1 each per socket, minimum VS+ = 15.5V ±0.5V, VS- = -15.5V ±0.5V, VR = 15.5 ±0.5V Irradiation Circuit HS-1840RH 28 LEAD DIP +15V NC NC +1V 1 2 3 4 5 6 7 8 9 10 11 12 13 14 28 27 26 25 24 23 22 21 20 19 18 17 16 15 -15V 1KΩ +5V NOTE: All irradiation testing is performed in the 28 lead CerDIP package. Spec Number 8 518022 HS-1840RH Schematic Diagrams ADDRESS INPUT BUFFER AND LEVEL SHIFTER V REF LEVEL SHIFTER V+ P P P P P P P P P LEVEL SHIFTED ADDRESS TO DECODE LEVEL SHIFTED ADDRESS TO DECODE OVERVOLTAGE PROTECTION V REF D2 R1 200Ω D1 P N R2 R5 R3 R4 R6 R8 N N N N N N N R7 ADD IN. N N V- ADDRESS DECODER +V P P P P P MULTIPLEX SWITCH V+ N A0 OR A0 A1 OR A1 A2 OR A2 A3 OR A3 N TO SWITCH P P P S IN N FROM DECODE D N N N N OUT ENABLE VV- Spec Number 9 518022 HS-1840RH Harris - Space Level Product Flow SEM - Traceable to Diffusion Method 2018, Modified This device does not meet MIL-STD-883 Method 2018.3 Class S minimum metal step coverage of 50%. The metal does meet the intent of the Class S requirement by meeting the current density requirement of