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LRGY3393-C1

LRGY3393-C1

  • 厂商:

    LIGITEK

  • 封装:

  • 描述:

    LRGY3393-C1 - TRIPLE COLOR LED LAMPS - LIGITEK electronics co., ltd.

  • 数据手册
  • 价格&库存
LRGY3393-C1 数据手册
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only TRIPLE COLOR LED LAMPS LRGY3393/C1 DATA SHEET DOC. NO : REV. DATE : : QW0905- LRGY3393/C1 A 15 - Dec.-2005 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LRGY3393/C1 Page 1/6 Package Dimensions 5.0 5.9 7.6 8.6 13.6±0.5 1.5MAX 0.1 0.4 25.0MIN □0.5 TYP 1 234 1.0MIN 4-1.27TYP 1.ANODE RED 2.COMMON CATHODE 3.ANODE YELLOW 4.ANODE GREEN 1.0MIN 1.0MIN Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. Directivity Radiation 0° -30° 30° -30° 0° 30 ° -60 ° 60 ° -60° 60° 100% 75% 50% 25% 0 25% 50% 75% 100% 100% 75% 50% 25% 0 25% 50% 75% 100% RED CHIP YELLOW CHIP ,GREEN CHIP LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO.LRGY3393/C1 Page 2/6 Absolute Maximum Ratings at Ta=25 ℃ Ratings Parameter Symbol URH Forward Current Peak Forward Current Duty 1/10@10KHz Power Dissipation Reverse Current @5V Electrostatic Discharge( * ) Operating Temperature Storage Temperature IF IFP PD Ir ESD Topr Tstg 50 100 130 10 2000 DGM 30 100 120 50 150 -20 ~ +80 -30 ~ +100 UYH 50 100 130 10 2000 mA mA mW UNIT μA V ℃ ℃ Static Electricity or power surge will the Use of anti-electrosatic * glove is recommended when handingdamageLED.LED.devices, a conductive wrist band or must be properly these All equipment and machinery grounded. Typical Electrical & Optical Characteristics (Ta=25 ℃) PART NO MATERIAL COLOR Forward Peak Dominant Spectral voltage wave halfwidth wave length △λ nm @20mA(V) length λPnm λDnm Viewing angle @20mA(mcd) 2θ 1/2 (deg) Luminous intensity Emitted AlGaInP/GaP Red Lens --Water Clear Min. Typ. Max. Min. Typ. 630 525 590 20 36 20 1.7 --- 2.6 1500 2700 --- 3.5 4.0 1.7 --- 2.6 900 1500 900 1500 20 12 12 LRGY3393/C1 InGaN/GaN Green 518 --- AlGaInP/GaP Yellow Note : 1.The forward voltage data did not including ±0.1V testing tolerance. 2. The luminous intensity data did not including ±15% testing tolerance. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO.LRGY3393/C1 Page 3/6 Typical Electro-Optical Characteristics Curve UR(H) CHIP Fig.1 Forward current vs. Forward Voltage 1000 Fig.2 Relative Intensity vs. Forward Current 3.5 Forward Current(mA) 100 10 Relative Intensity Normalize @20mA 1.0 1.5 2.0 2.5 3.0 3.0 2.5 2.0 1.5 1.0 0.5 0.0 1 10 100 1000 1 01 Forward Voltage(V) Fig.3 Forward Voltage vs. Temperature 1.2 Forward Current(mA) Fig.4 Relative Intensity vs. Temperature Forward Voltage@20mA Normalize @25℃ Relative Intensity@20mA Normalize @25℃ -40 -20 0 20 40 60 80 100 3.0 2.5 2.0 1.5 1.0 0.5 0.0 -40 -20 0 20 40 60 80 100 1.1 1.0 0.9 0.8 Ambient Temperature( ℃) Ambient Temperature( ℃) Fig.5 Relative Intensity vs. Wavelength Relative Intensity@20mA 1.0 0.5 0.0 550 600 650 700 Wavelength (nm) LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO.LRGY3393/C1 Page 4/6 Typical Electro-Optical Characteristics Curve DGM CHIP Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current 1000 3.0 Forward Current(mA) 100 Relative Intensity Normalize @20mA 1.0 2.0 3.0 4.0 5.0 2.5 2.0 1.5 1.0 0.5 0.0 1.0 10 100 1000 10 1.0 0.1 Forward Voltage(V) Fig.3 Forward Voltage vs. Temperature 1.2 Forward Current(mA) Fig.4 Relative Intensity vs. Temperature 3.0 Forward Voltage@20mA Normalize @25℃ Relative Intensity@20mA Normalize @25℃ 1.1 2.5 2.0 1.5 1.0 0.5 0.0 -40 -20 0 20 40 60 80 100 1.0 0.9 0.8 -40 -20 0 20 40 60 80 100 Ambient Temperature( ℃) Ambient Temperature( ℃) Fig.5 Relative Intensity vs. Wavelength 1.0 Relative Intensity@20mA 0.5 0.0 450 500 550 600 Wavelength (nm) LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO.LRGY3393/C1 Page 5/6 Typical Electro-Optical Characteristics Curve UY(H) CHIP Fig.1 Forward Current vs. Forward Voltage 1000 Fig.2 Relative Intensity vs. Forward Current 3.0 Forward Current(mA) 100 10 1.0 Relative Intensity Normalize @20mA 2.0 3.0 4.0 5.0 2.5 2.0 1.5 1.0 0.5 0.0 1.0 10 100 1000 0.1 1.0 Forward Voltage(V) Fig.3 Forward Voltage vs. Temperature 1.2 Forward Current(mA) Fig.4 Relative Intensity vs. Temperature 3.0 Forward Voltage@20mA Normalize @25℃ Relative Intensity@20mA Normalize @25℃ 2.5 2.0 1.5 1.0 0.5 0.0 -40 -20 0 20 40 60 80 100 1.1 1.0 0.9 0.8 -40 -20 0 20 40 60 80 100 Ambient Temperature( ℃) Ambient Temperature( ℃) Fig.5 Relative Intensity vs. Wavelength Relative Intensity@20mA 1.0 0.5 0.0 500 550 600 650 Wavelength (nm) LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO.LRGY3393/C1 Page 6/6 Reliability Test: Test Item Test Condition 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) Description This test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. Reference Standard MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 Operating Life Test High Temperature Storage Test 1.Ta=105 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. MIL-STD-883:1008 JIS C 7021: B-10 Low Temperature Storage Test 1.Ta=-40 ℃±5 ℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. JIS C 7021: B-12 High Temperature High Humidity Test 1.Ta=65 ℃±5 ℃ 2.RH=90 %~95% 3.t=240hrs ±2hrs The purpose of this test is the resistance of the device under tropical for hous. MIL-STD-202:103B JIS C 7021: B-11 Thermal Shock Test 1.Ta=105 ℃±5℃&-40 ℃±5℃ (10min) (10min) 2.total 10 cycles The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 Solder Resistance Test 1.T.Sol=260 ℃±5 ℃ 2.Dwell time= 10 ±1sec. MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 Solderability Test 1.T.Sol=230 ℃±5 ℃ 2.Dwell time=5 ±1sec This test intended to see soldering well performed or not. MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2
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