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AWP 252010FW-1R0M

AWP 252010FW-1R0M

  • 厂商:

    TAI-TECH(台庆)

  • 封装:

    1008

  • 描述:

    1 µH 无屏蔽 模制 电感器 3 A 62 毫欧最大 1008(2520 公制)

  • 数据手册
  • 价格&库存
AWP 252010FW-1R0M 数据手册
TAI-TECH P2. Power Inductor AWP-SERIES 1.Features 1. This specification applies Low Profile Power Inductors. 2. 100% Lead(Pb) & Halogen-Free and RoHS compliant. 3. Operating temperature :-40~+125℃ (Including self - temperature rise). Halogen Halogen-free Recommended PC Board Pattern 2.Dimensions Series A(mm) B(mm) C(mm) D(mm) AWP252010FW 2.5±0.2 2.0±0.2 1.0 max 0.5±0.3 AWP252012FW 2.5±0.2 2.0±0.2 1.2 max 0.55±0.25 AWP322512FW 3.2±0.3 2.5±0.3 1.0±0.2 0.6±0.3 AWP252012FA 2.5±0.2 2.0±0.2 1.0±0.2 0.55±0.25 AWP252012NA 2.5±0.2 2.0±0.2 1.2 max 0.55±0.25 AWP252012RA 2.5±0.2 2.0±0.2 1.2 max 0.55±0.25 Series L(mm) G(mm) H(mm) AWP252010FW 2.8 1.2 2.3 AWP252012FW 2.8 1.2 2.0 AWP322512FW 3.8 1.2 2.9 AWP252012FA 2.8 1.2 2.0 AWP252012NA 2.8 1.2 2.0 AWP252012RA 2.8 1.2 2.0 Series A(mm) B(mm) C(mm) D(mm) Series L(mm) G(mm) H(mm) AWP252010HF 2.5±0.2 2.0±0.2 0.90±0.1 0.5±0.3 AWP252010HF 2.8 1.2 2.0 3.Part Numbering AWP 252010 FW A B C A: Series B: Dimension C: Material D: Inductance E: Inductance Tolerance - 2R2 M D E Flat wire 2R2=2.20uH K=±10%, L=±15%, M=±20%, Y=±30%. www.tai-tech.com.tw TAI-TECH AWP P3. 252012 NA - A B C A: Series B: Dimension C: Material D: Inductance E: Inductance Tolerance AWP 252010 FW A B 1R0 M D Round wire 1R0=1.0uH K=±10%, L=±15%, M=±20%, Y=±30%. - 2R2 M C A: Series B: Dimension C: Material D: Inductance E: Inductance Tolerance F: Code E D - CPI F E Flat wire 2R2=2.20uH K=±10%, L=±15%, M=±20%, Y=±30%. 4.Specification Part Number Inductance (uH)±20% @0A Test Frequency (Hz) I rms (A) I sat (A) AWP252010FW-R24M 0.24 1M/1V 5.7 AWP252010FW-R36M DCR (mΩ) Typ Max 6.3 18 22 0.36 1M/1V 4.7 4.9 23 28 AWP252010FW-R47M 0.47 1M/1V 4.4 4.5 28 34 AWP252010FW-R68M 0.68 1M/1V 4.2 4.3 34 41 AWP252010FW-R82M 0.82 1M/1V 3.8 4.0 40 48 AWP252010FW-1R0M 1.00 1M/1V 3.4 3.7 52 62 AWP252010FW-1R5M 1.50 1M/1V 2.6 2.9 82 98 AWP252010FW-2R2M 2.20 1M/1V 2.2 2.3 105 126 AWP252010FW-3R3M 3.30 1M/1V 2.0 2.1 130 156 AWP252010FW-4R7M 4.70 1M/1V 1.4 1.6 230 264 Part Number Inductance (uH)±20% @0A Test Frequency (Hz) Typ Max Typ Max Typ Max AWP252012FW-R10Y 0.10 1M/1V 11.0 10.0 11.0 10.0 5 6.5 AWP252012FW-R22M 0.22 1M/1V 6.5 5.7 7.7 6.7 15 18 AWP252012FW-R24M 0.24 1M/1V 6.2 5.5 7.5 6.5 15 18 AWP252012FW-R36M 0.36 1M/1V 5.4 4.7 6.1 5.6 17 21 AWP252012FW-R47M 0.47 1M/1V 5.0 4.4 5.5 4.6 21 25 AWP252012FW-R56M 0.56 1M/1V 4.8 4.1 5.0 4.5 24 29 AWP252012FW-R68M 0.68 1M/1V 4.5 3.9 4.6 4.0 28 34 AWP252012FW-R82M 0.82 1M/1V 4.1 3.6 4.3 3.8 32 39 AWP252012FW-1R0M 1.00 1M/1V 3.7 3.3 4.0 3.6 37 45 AWP252012FW-1R5M 1.50 1M/1V 3.0 2.6 3.3 2.9 60 72 AWP252012FW-2R2M 2.20 1M/1V 2.5 2.2 2.6 2.3 81 98 AWP252012FW-3R3M 3.30 1M/1V 2.2 1.9 2.3 2.1 112 134 AWP252012FW-4R7M 4.70 1M/1V 1.8 1.6 1.8 1.6 175 210 AWP252012FW-6R8M 6.80 0.1V/1M 1.5 1.3 1.7 1.5 260 300 I rms (A) www.tai-tech.com.tw I sat (A) DCR (mΩ) TAI-TECH P4. Part Number Inductance (uH)±20% @0A Test Frequency (Hz) Typ Max Typ Max Typ Max AWP322512FW-R33M 0.33 100K/1V 8.0 7.5 8.2 7.8 11 14 AWP322512FW-R47M 0.47 100K/1V 7.0 6.6 7.5 7.0 16 20 AWP322512FW-R68M 0.68 100K/1V 6.2 5.7 5.7 5.1 23 28 AWP322512FW-1R0M 1.00 100K/1V 5.3 4.9 5.5 5.0 28 34 AWP322512FW-1R5M 1.50 100K/1V 4.1 3.5 4.3 3.7 48 58 AWP322512FW-2R2M 2.20 100K/1V 3.4 3.0 3.5 3.0 62 71 AWP322512FW-3R3M 3.30 100K/1V 2.8 2.2 2.6 2.3 88 101 Part Number Inductance (uH)±20% @0A Test Frequency (Hz) Typ Max Typ Max Typ Max AWP252012FA-1R0M 1.0 1V/100K 3.8 3.4 4.0 3.6 35 42 AWP252012FA-1R5M 1.5 1V/100K 3.0 2.6 3.3 2.9 60 72 Part Number Inductance (uH)±20% @0A Test Frequency (Hz) Typ Max Typ Max Typ Max AWP252012NA-1R0M 1.0 1M/1V 3.8 3.4 4.0 3.6 35 42 AWP252012NA-1R5M 1.5 1M/1V 3.0 2.6 3.3 2.9 60 72 Part Number Inductance (uH)±20% @0A Test Frequency (Hz) I rms (A) I sat (A) AWP252010FW-R47M-CPI 0.47 1M/1V 4.4 AWP252010FW-1R0M-CPI 1.00 1M/1V AWP252010FW-2R2M-CPI 2.20 1M/1V I rms (A) I rms (A) 34 3.4 3.7 52 62 2.0 2.2 86 90 Material name 2 Circuit-Copper Copper Wire 3 Terminal Silver paste DCR (mΩ) 28 AWP252010FW/252012FW/322512FW/AWP252012FA/AWP252012NA Alloy Powder DCR (mΩ) 4.5 5.Material List Alloy Body I sat (A) Max 2.Irms:Heat Rated Current (Irms) will cause the coil temperature rise approximately ΔT of 40℃. 3.Rated DC current: The lower value of Irms and Isat. 1 DCR (mΩ) Typ 1.Isat:Saturation Current (Isat) will cause L0 to drop approximately 30%. Composition part DCR (mΩ) I sat (A) I rms (A) Note: No. I sat (A) www.tai-tech.com.tw P5. TAI-TECH 6.Packaging Information 6-1. Reel Dimension Size Type A(mm) B(mm) C(mm) D(mm) 252010/252012/3225 7”x8mm 8.4±1.5/-0 60±1.0 13+0.5/-0.2 178±2.0 C B D A 7"x8mm 6-2. Tape Dimension 1 0. 5+ 1. D: Po:4±0.1 t A P 0.1 :1± D1 F:3.5±0.05 A Bo W:8.0±0.1 E:1.75±0.1 P2:2±0.05 Ko Ao Size Bo(mm) Ao(mm) Ko(mm) P(mm) t(mm) 252010FW 2.90±0.1 2.30±0.1 1.15±0.1 4.0±0.1 0.23±0.05 252012FW 3.10±0.1 2.45±0.1 1.40±0.1 4.0±0.1 0.23±0.05 252012FA 3.10±0.1 2.45±0.1 1.40±0.1 4.0±0.1 0.23±0.05 252012NA 3.10±0.1 2.45±0.1 1.40±0.1 4.0±0.1 0.23±0.05 SECTION A-A t P Bo Po:4∮0.1 W:8.0∮0.1 P2:2∮0.05 Ko Ao Size Bo(mm) Ao(mm) Ko(mm) 322512FW 3.60±0.10 2.90±0.10 1.4±0.10 P(mm) t(mm) 4.00±0.10 0.23±0.05 6-3. Packaging Quantity Chip size 252010 252012 322512 Chip / Reel 3000 3000 2000 6-4. Tearing Off Force F Top cover tape The force for tearing off cover tape is 10 to 100 grams in the arrow direction under the following conditions(referenced ANSI/EIA-481-D-2008 of 4.11 standard). 165° to180° Base tape Tearing Speed mm Room Temp. (℃) Room Humidity (%) Room atm (hPa) 300±10% 5~35 45~85 860~1060 www.tai-tech.com.tw TAI-TECH P6. 7.Reliability and Test Condition Item Operating temperature Storage temperature Performance Test Condition -40~+125℃ (Including self - temperature rise) 1. -10~+40℃,50~60%RH (Product with taping) 2. -40~+125℃(on board) Electrical Performance Test HP4284A,CH11025,CH3302,CH1320,CH1320S Inductance Refer to standard electrical characteristics list. DCR Saturation Current (Isat) LCR Meter. CH16502,Agilent33420A Micro-Ohm Meter. Saturation DC Current (Isat) will cause L0 Approximately △L30%. to drop △L(%) Heat Rated Current (Irms) will cause the coil temperature rise Heat Rated Current (Irms) △T(℃) without core loss. Approximately △T40℃ 1.Applied the allowed DC current 2.Temperature measured by digital surface thermometer Reliability Test Preconditioning: Run through IR reflow for 3 times.( IPC/JEDEC J-STD-020E Classification Reflow Profiles) Temperature: 125±2℃(Inductor,ambient + temp rise) Life Test Applied current:rated current Duration:1000±12hrs Measured at room temperature after placing for 24±2 hrs Preconditioning: Run through IR reflow for 3times. ( IPC/JEDECJ-STD-020E Classification Reflow Profiles) Humidity:85±2﹪R.H, Load Humidity Temperature:85℃±2℃ Duration:1000hrs Min. Bead:with 100% rated current, Inductance:with 100% rated current Measured at room temperature after placing for 24±2 hrs. Preconditioning: Run through IR reflow for 3 times. ( IPC/JEDECJ-STD-020E Classification Reflow Profiles) 1. Baked at50℃ for 25hrs, measured at room temperature after placing for 4 hrs. 2. Raise temperature to 65 ± 2 ℃ 90-100%RH in 2.5hrs, and Moisture Resistance keep 3 hours, cool down to 25℃ in 2.5hrs. Appearance:No damage. 3. Raise temperature to 65 ± 2 ℃ 90-100%RH in 2.5hrs, and Inductance:within±10% of initial value keep 3 hours, cool down to 25℃ in Q:Shall not exceed the specification value. 2.5hrs,keep at 25℃ for 2 hrs then keep at -10℃ for 3 hrs RDC:within ±15% of initial value and shall not 4. Keep at 25 ℃ 80-100%RH for 15min and vibrate at the exceed the specification value frequency of 10 to 55 Hz to 10 Hz, measure at room temperature after placing for 1~2 hrs. Preconditioning: Run through IR reflow for 3 times. ( IPC/JEDECJ-STD-020E Classification Reflow Profiles) Thermal Condition for 1 cycle shock Step1:-40±2℃ 30±5min Step2:125±2℃ ≦0.5min Step3:125±2℃ 30±5minNumber of cycles: 500 Measured at room fempraturc after placing for 24±2 hrs. Preconditioning: Run through IR reflow for 3 times. ( IPC/JEDECJ-STD-020E Classification Reflow Profiles) Oscillation Frequency: 10Hz~2KHz~10Hz for 20 minutes Vibration Equipment: Vibration checker Total Amplitude: 10g Testing Time : 12 hours(20 minutes, 12 cycles each of 3 orientations)。 www.tai-tech.com.tw TAI-TECH P7. Item Performance Bending Appearance:No damage. Inductance:within±10% of initial value Q:Shall not exceed the specification value. RDC:within ±15% of initial value and shall not exceed the specification value Shock Test Condition Shall be mounted on a FR4 substrate of the following dimensions: >=0805 inch(2012mm):40x100x1.2mm =0805 inch(2012mm):1.2mm 0805inch(2012mm):1kg,
AWP 252010FW-1R0M 价格&库存

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