TAI-TECH
P2.
Power Inductor
AWP-SERIES
1.Features
1. This specification applies Low Profile Power Inductors.
2. 100% Lead(Pb) & Halogen-Free and RoHS compliant.
3. Operating temperature :-40~+125℃ (Including self - temperature rise).
Halogen
Halogen-free
Recommended PC Board Pattern
2.Dimensions
Series
A(mm)
B(mm)
C(mm)
D(mm)
AWP252010FW
2.5±0.2
2.0±0.2
1.0 max
0.5±0.3
AWP252012FW
2.5±0.2
2.0±0.2
1.2 max
0.55±0.25
AWP322512FW
3.2±0.3
2.5±0.3
1.0±0.2
0.6±0.3
AWP252012FA
2.5±0.2
2.0±0.2
1.0±0.2
0.55±0.25
AWP252012NA
2.5±0.2
2.0±0.2
1.2 max
0.55±0.25
AWP252012RA
2.5±0.2
2.0±0.2
1.2 max
0.55±0.25
Series
L(mm)
G(mm)
H(mm)
AWP252010FW
2.8
1.2
2.3
AWP252012FW
2.8
1.2
2.0
AWP322512FW
3.8
1.2
2.9
AWP252012FA
2.8
1.2
2.0
AWP252012NA
2.8
1.2
2.0
AWP252012RA
2.8
1.2
2.0
Series
A(mm)
B(mm)
C(mm)
D(mm)
Series
L(mm)
G(mm)
H(mm)
AWP252010HF
2.5±0.2
2.0±0.2
0.90±0.1
0.5±0.3
AWP252010HF
2.8
1.2
2.0
3.Part Numbering
AWP 252010 FW
A
B
C
A: Series
B: Dimension
C: Material
D: Inductance
E: Inductance Tolerance
-
2R2 M
D
E
Flat wire
2R2=2.20uH
K=±10%, L=±15%, M=±20%, Y=±30%.
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TAI-TECH
AWP
P3.
252012 NA
-
A
B
C
A: Series
B: Dimension
C: Material
D: Inductance
E: Inductance Tolerance
AWP 252010 FW
A
B
1R0 M
D
Round wire
1R0=1.0uH
K=±10%, L=±15%, M=±20%, Y=±30%.
-
2R2 M
C
A: Series
B: Dimension
C: Material
D: Inductance
E: Inductance Tolerance
F: Code
E
D
-
CPI
F
E
Flat wire
2R2=2.20uH
K=±10%, L=±15%, M=±20%, Y=±30%.
4.Specification
Part Number
Inductance
(uH)±20%
@0A
Test
Frequency
(Hz)
I rms (A)
I sat (A)
AWP252010FW-R24M
0.24
1M/1V
5.7
AWP252010FW-R36M
DCR (mΩ)
Typ
Max
6.3
18
22
0.36
1M/1V
4.7
4.9
23
28
AWP252010FW-R47M
0.47
1M/1V
4.4
4.5
28
34
AWP252010FW-R68M
0.68
1M/1V
4.2
4.3
34
41
AWP252010FW-R82M
0.82
1M/1V
3.8
4.0
40
48
AWP252010FW-1R0M
1.00
1M/1V
3.4
3.7
52
62
AWP252010FW-1R5M
1.50
1M/1V
2.6
2.9
82
98
AWP252010FW-2R2M
2.20
1M/1V
2.2
2.3
105
126
AWP252010FW-3R3M
3.30
1M/1V
2.0
2.1
130
156
AWP252010FW-4R7M
4.70
1M/1V
1.4
1.6
230
264
Part Number
Inductance
(uH)±20%
@0A
Test
Frequency
(Hz)
Typ
Max
Typ
Max
Typ
Max
AWP252012FW-R10Y
0.10
1M/1V
11.0
10.0
11.0
10.0
5
6.5
AWP252012FW-R22M
0.22
1M/1V
6.5
5.7
7.7
6.7
15
18
AWP252012FW-R24M
0.24
1M/1V
6.2
5.5
7.5
6.5
15
18
AWP252012FW-R36M
0.36
1M/1V
5.4
4.7
6.1
5.6
17
21
AWP252012FW-R47M
0.47
1M/1V
5.0
4.4
5.5
4.6
21
25
AWP252012FW-R56M
0.56
1M/1V
4.8
4.1
5.0
4.5
24
29
AWP252012FW-R68M
0.68
1M/1V
4.5
3.9
4.6
4.0
28
34
AWP252012FW-R82M
0.82
1M/1V
4.1
3.6
4.3
3.8
32
39
AWP252012FW-1R0M
1.00
1M/1V
3.7
3.3
4.0
3.6
37
45
AWP252012FW-1R5M
1.50
1M/1V
3.0
2.6
3.3
2.9
60
72
AWP252012FW-2R2M
2.20
1M/1V
2.5
2.2
2.6
2.3
81
98
AWP252012FW-3R3M
3.30
1M/1V
2.2
1.9
2.3
2.1
112
134
AWP252012FW-4R7M
4.70
1M/1V
1.8
1.6
1.8
1.6
175
210
AWP252012FW-6R8M
6.80
0.1V/1M
1.5
1.3
1.7
1.5
260
300
I rms (A)
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I sat (A)
DCR (mΩ)
TAI-TECH
P4.
Part Number
Inductance
(uH)±20%
@0A
Test
Frequency
(Hz)
Typ
Max
Typ
Max
Typ
Max
AWP322512FW-R33M
0.33
100K/1V
8.0
7.5
8.2
7.8
11
14
AWP322512FW-R47M
0.47
100K/1V
7.0
6.6
7.5
7.0
16
20
AWP322512FW-R68M
0.68
100K/1V
6.2
5.7
5.7
5.1
23
28
AWP322512FW-1R0M
1.00
100K/1V
5.3
4.9
5.5
5.0
28
34
AWP322512FW-1R5M
1.50
100K/1V
4.1
3.5
4.3
3.7
48
58
AWP322512FW-2R2M
2.20
100K/1V
3.4
3.0
3.5
3.0
62
71
AWP322512FW-3R3M
3.30
100K/1V
2.8
2.2
2.6
2.3
88
101
Part Number
Inductance
(uH)±20%
@0A
Test
Frequency
(Hz)
Typ
Max
Typ
Max
Typ
Max
AWP252012FA-1R0M
1.0
1V/100K
3.8
3.4
4.0
3.6
35
42
AWP252012FA-1R5M
1.5
1V/100K
3.0
2.6
3.3
2.9
60
72
Part Number
Inductance
(uH)±20%
@0A
Test
Frequency
(Hz)
Typ
Max
Typ
Max
Typ
Max
AWP252012NA-1R0M
1.0
1M/1V
3.8
3.4
4.0
3.6
35
42
AWP252012NA-1R5M
1.5
1M/1V
3.0
2.6
3.3
2.9
60
72
Part Number
Inductance
(uH)±20%
@0A
Test
Frequency
(Hz)
I rms (A)
I sat (A)
AWP252010FW-R47M-CPI
0.47
1M/1V
4.4
AWP252010FW-1R0M-CPI
1.00
1M/1V
AWP252010FW-2R2M-CPI
2.20
1M/1V
I rms (A)
I rms (A)
34
3.4
3.7
52
62
2.0
2.2
86
90
Material name
2
Circuit-Copper
Copper Wire
3
Terminal
Silver paste
DCR (mΩ)
28
AWP252010FW/252012FW/322512FW/AWP252012FA/AWP252012NA
Alloy Powder
DCR (mΩ)
4.5
5.Material List
Alloy Body
I sat (A)
Max
2.Irms:Heat Rated Current (Irms) will cause the coil temperature rise approximately ΔT of 40℃.
3.Rated DC current: The lower value of Irms and Isat.
1
DCR (mΩ)
Typ
1.Isat:Saturation Current (Isat) will cause L0 to drop approximately 30%.
Composition part
DCR (mΩ)
I sat (A)
I rms (A)
Note:
No.
I sat (A)
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P5.
TAI-TECH
6.Packaging Information
6-1. Reel Dimension
Size
Type
A(mm)
B(mm)
C(mm)
D(mm)
252010/252012/3225
7”x8mm
8.4±1.5/-0
60±1.0
13+0.5/-0.2
178±2.0
C
B
D
A
7"x8mm
6-2. Tape Dimension
1
0.
5+
1.
D:
Po:4±0.1
t
A
P
0.1
:1±
D1
F:3.5±0.05
A
Bo
W:8.0±0.1
E:1.75±0.1
P2:2±0.05
Ko
Ao
Size
Bo(mm)
Ao(mm)
Ko(mm)
P(mm)
t(mm)
252010FW
2.90±0.1
2.30±0.1
1.15±0.1
4.0±0.1
0.23±0.05
252012FW
3.10±0.1
2.45±0.1
1.40±0.1
4.0±0.1
0.23±0.05
252012FA
3.10±0.1
2.45±0.1
1.40±0.1
4.0±0.1
0.23±0.05
252012NA
3.10±0.1
2.45±0.1
1.40±0.1
4.0±0.1
0.23±0.05
SECTION A-A
t
P
Bo
Po:4∮0.1
W:8.0∮0.1
P2:2∮0.05
Ko
Ao
Size
Bo(mm)
Ao(mm)
Ko(mm)
322512FW 3.60±0.10 2.90±0.10
1.4±0.10
P(mm)
t(mm)
4.00±0.10 0.23±0.05
6-3. Packaging Quantity
Chip size
252010
252012
322512
Chip / Reel
3000
3000
2000
6-4. Tearing Off Force
F
Top cover tape
The force for tearing off cover tape is 10 to 100 grams in the arrow direction
under the following conditions(referenced ANSI/EIA-481-D-2008 of 4.11
standard).
165° to180°
Base tape
Tearing Speed
mm
Room Temp.
(℃)
Room Humidity
(%)
Room atm
(hPa)
300±10%
5~35
45~85
860~1060
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TAI-TECH
P6.
7.Reliability and Test Condition
Item
Operating temperature
Storage temperature
Performance
Test Condition
-40~+125℃ (Including self - temperature rise)
1. -10~+40℃,50~60%RH (Product with taping)
2. -40~+125℃(on board)
Electrical Performance Test
HP4284A,CH11025,CH3302,CH1320,CH1320S
Inductance
Refer to standard electrical characteristics list.
DCR
Saturation Current (Isat)
LCR Meter.
CH16502,Agilent33420A Micro-Ohm Meter.
Saturation DC Current (Isat) will cause L0
Approximately △L30%.
to drop △L(%)
Heat Rated Current (Irms) will cause the coil temperature rise
Heat Rated Current (Irms)
△T(℃) without core loss.
Approximately △T40℃
1.Applied the allowed DC current
2.Temperature measured by digital surface thermometer
Reliability Test
Preconditioning: Run through IR reflow for 3 times.( IPC/JEDEC
J-STD-020E Classification Reflow Profiles)
Temperature: 125±2℃(Inductor,ambient + temp rise)
Life Test
Applied current:rated current
Duration:1000±12hrs
Measured at room temperature after placing for 24±2 hrs
Preconditioning: Run through IR reflow for 3times.
( IPC/JEDECJ-STD-020E Classification Reflow Profiles)
Humidity:85±2﹪R.H,
Load Humidity
Temperature:85℃±2℃
Duration:1000hrs Min. Bead:with 100% rated current,
Inductance:with 100% rated current
Measured at room temperature after placing for 24±2 hrs.
Preconditioning: Run through IR reflow for 3 times.
( IPC/JEDECJ-STD-020E Classification Reflow Profiles)
1. Baked at50℃ for 25hrs, measured at room temperature after
placing for 4 hrs.
2. Raise temperature to 65 ± 2 ℃ 90-100%RH in 2.5hrs, and
Moisture Resistance
keep 3 hours, cool down to 25℃ in 2.5hrs.
Appearance:No damage.
3. Raise temperature to 65 ± 2 ℃ 90-100%RH in 2.5hrs, and
Inductance:within±10% of initial value
keep 3 hours, cool down to 25℃ in
Q:Shall not exceed the specification value.
2.5hrs,keep at 25℃ for 2 hrs then keep at -10℃ for 3 hrs
RDC:within ±15% of initial value and shall not
4. Keep at 25 ℃ 80-100%RH for 15min and vibrate at the
exceed the specification value
frequency of 10 to 55 Hz to 10 Hz, measure at
room temperature after placing for 1~2 hrs.
Preconditioning: Run through IR reflow for 3 times.
( IPC/JEDECJ-STD-020E Classification Reflow Profiles)
Thermal
Condition for 1 cycle
shock
Step1:-40±2℃ 30±5min
Step2:125±2℃ ≦0.5min
Step3:125±2℃ 30±5minNumber of cycles: 500
Measured at room fempraturc after placing for 24±2 hrs.
Preconditioning: Run through IR reflow for 3 times.
( IPC/JEDECJ-STD-020E Classification Reflow Profiles)
Oscillation Frequency: 10Hz~2KHz~10Hz for 20 minutes
Vibration
Equipment: Vibration checker
Total Amplitude: 10g
Testing Time : 12 hours(20 minutes, 12 cycles each of 3
orientations)。
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TAI-TECH
P7.
Item
Performance
Bending
Appearance:No damage.
Inductance:within±10% of initial value
Q:Shall not exceed the specification value.
RDC:within ±15% of initial value and shall not
exceed the specification value
Shock
Test Condition
Shall be mounted on a FR4 substrate of the
following dimensions: >=0805 inch(2012mm):40x100x1.2mm
=0805 inch(2012mm):1.2mm
0805inch(2012mm):1kg,
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