SWD056R68E7T

SW056R68E7T N-channel Enhanced mode TO-252 MOSFET Features TO-252 ⚫ ⚫ ⚫ ⚫ ⚫ ⚫ High ruggedness Low RDS(ON) (Typ 5.8mΩ)@VGS=10V Low Gate Charge (Typ 102nC) Improved dv/dt Capability 100% Avalanche Tested Application:Synchronous Rectification, Li Battery Protect Board, Inverter BVDSS : 68V ID : 100A RDS(ON) :5.8mΩ 1 2 2 3 1 1. Gate 2.Drain 3.Source General Description 3 This power MOSFET is produced with advanced technology of SAMWIN. This technology enable the power MOSFET to have better characteristics, including fast switching time, low on resistance, low gate charge and especially excellent avalanche characteristics. Order Codes Item Sales Type Marking Package Packaging 1 SW D 056R68E7T SW056R68E7T TO-252 REEL Value Unit 68 V Continuous drain current (@TC=25oC) 100* A Continuous drain current (@TC=100oC) 79* A 400 A ± 20 V Absolute maximum ratings Symbol VDSS Parameter Drain to source voltage ID IDM Drain current pulsed (note 1) VGS Gate to source voltage EAS Single pulsed avalanche energy (note 2) 289 mJ EAR Repetitive avalanche energy (note 1) 28 mJ dv/dt Peak diode recovery dv/dt (note 3) 5 V/ns 178.6 W 1.4 W/oC -55 ~ + 150 oC Total power dissipation (@TC=25oC) PD Derating factor above 25oC TSTG, TJ Operating junction temperature & storage temperature *. Drain current is limited by junction temperature. Thermal characteristics Symbol Rthjc Parameter Thermal resistance, Junction to case Copyright@ Semipower Technology Co., Ltd. All rights reserved. Value Unit 0.7 oC/W May.2022. Rev. 2.0 1/6 SW056R68E7T Electrical characteristic ( TJ = 25oC unless otherwise specified ) Symbol Parameter Test conditions Min. Typ. Max. Unit Off characteristics BVDSS Drain to source breakdown voltage VGS=0V, ID=250uA 68 ΔBVDSS / ΔTJ Breakdown voltage temperature coefficient ID=250uA, referenced to 25oC IDSS Drain to source leakage current V V/oC 0.05 VDS=68V, VGS=0V 1 uA VDS=54V, TJ=125oC 50 uA Gate to source leakage current, forward VGS=20V, VDS=0V 100 nA Gate to source leakage current, reverse VGS=-20V, VDS=0V -100 nA 4 V 7.1 mΩ IGSS On characteristics VGS(TH) RDS(ON) Gfs Gate threshold voltage Drain to source on state resistance Forward transconductance VDS=VGS, ID=250uA 2 =25oC VGS=10V, ID=30A,TJ 5.8 VGS=10V, ID=30A,TJ=125oC 9.6 mΩ VDS=10V, ID=30A 45 S Dynamic characteristics Ciss Input capacitance Coss Output capacitance Crss Reverse transfer capacitance td(on) Turn on delay time tr td(off) tf Rising time Turn off delay time 5178 VGS=0V, VDS=34V, f=1MHz 357 pF 320 39 VDS=34V, ID=30A, RG=4.7Ω, VGS=10V (note 4,5) 80 ns 95 Fall time 35 Qg Total gate charge 102 Gate-drain charge VDS=54V, VGS=10V, ID=30A , IG=3mA (note 4,5) Qgs Gate-source charge Qgd Rg Gate resistance VDS=0V, Scan F mode 3.3 28 nC 37 Ω Source to drain diode ratings characteristics Symbol Parameter Test conditions IS Continuous source current ISM Pulsed source current Integral reverse p-n Junction diode in the MOSFET VSD Diode forward voltage drop. IS=50A, VGS=0V trr Reverse recovery time Qrr Reverse recovery charge IS=30A, VGS=0V, dIF/dt=100A/us Min. Typ. Max. Unit 100 A 400 A 1.4 V 31 ns 28 nC ※. Notes 1. Repeatitive rating : pulse width limited by junction temperature. 2. L =0.5mH, IAS =34A, VDD=40V, RG=25Ω, Starting TJ = 25oC 3. ISD ≤30A, di/dt = 100A/us, VDD ≤ BVDSS, Staring TJ =25oC 4. Pulse Test : Pulse Width ≤ 300us, duty cycle ≤ 2%. 5. Essentially independent of operating temperature. Copyright@ Semipower Technology Co., Ltd. All rights reserved. May.2022. Rev. 2.0 2/6 SW056R68E7T Fig. 1. On-state characteristics Fig. 2. Transfer Characteristics Fig. 3. On-resistance variation vs. drain current and gate voltage Fig. 4. On-state current vs. diode forward voltage Fig 5. Breakdown voltage variation vs. junction temperature Fig. 6. On-resistance variation vs. junction temperature Copyright@ Semipower Technology Co., Ltd. All rights reserved. May.2022. Rev. 2.0 3/6 SW056R68E7T Fig. 7. Gate charge characteristics Fig. 9. Maximum safe operating area Fig. 8. Capacitance Characteristics Fig. 10. Maximum drain current vs. case temperature Fig. 11. Transient thermal response curve Copyright@ Semipower Technology Co., Ltd. All rights reserved. May.2022. Rev. 2.0 4/6 SW056R68E7T Fig. 12. Gate charge test circuit & waveform Fig. 13. Switching time test circuit & waveform VDS 90% RL RGS VDS VDD VIN 10VIN DUT 10% 10% td(on) tr tON td(off) tf tOFF Fig. 14. Unclamped Inductive switching test circuit & waveform Copyright@ Semipower Technology Co., Ltd. All rights reserved. May.2022. Rev. 2.0 5/6 SW056R68E7T Fig. 15. Peak diode recovery dv/dt test circuit & waveform DUT + V DS 10V VGS (DRIVER) L IS di/dt IS (DUT) IRM VDS RG Diode reverse current VDD Diode recovery dv/dt Same type as DUT 10VGS VDS (DUT) *. dv/dt controlled by RG *. Is controlled by pulse period VDD VF Body diode forward voltage drop DISCLAIMER * All the data & curve in this document was tested in SEMIPOWER TESTING & APPLICATION CENTER. * This product has passed the PCT,TC,HTRB,HTGB,HAST,PC and Solderdunk reliability testing. * Qualification standards can also be found on the Web site (http://www.semipower.com.cn) * Suggestions for improvement are appreciated, Please send your suggestions to samwin@samwinsemi.com Copyright@ Semipower Technology Co., Ltd. All rights reserved. May.2022. Rev. 2.0 6/6